Analysis of scattering properties of embedded particles by applying the discrete sources method
Žurnal vyčislitelʹnoj matematiki i matematičeskoj fiziki, Tome 52 (2012) no. 9, pp. 1666-1675
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A numerical scheme based on the discrete sources method is constructed for the mathematical simulation of the scattering properties of nanoparticles embedded in a substrate. Both differential and integral scattering characteristics of particles embedded to various degrees are analyzed. It is shown that embedded particles can be distinguished from those lying on the substrate by using $P$-polarized external excitation waves incident at two different angles.
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