Voir la notice de l'article provenant de la source Math-Net.Ru
[1] Arndt D. P., Azzam R. M. A., Bennet J. M. et al., “Multiple determination of optical constants of thin-film coating materials”, Appl. Optics, 23:20 (1984), 3571–3596 | DOI
[2] Bartella J., Birning P. H., Bovard B. et al., “Multiple analysis of unknown optical miltilayer coating”, Appl. Optics, 24:16 (1985), 2625–2646 | DOI
[3] Grossman P., Offerman V., “Analysis of reflectance data using Kramers-Kronig relation”, Appl. Phys. A, 52 (1991), 138–144 | DOI
[4] Khudak Yu. M., Glasko V. B., “Additivnye predstavleniya kharakteristik sloistoi sredy i problema edinstvennosti obratnykh zadach”, Zh. vychisl. matem. i matem. fiz., 20:2 (1980), 482–490 | MR
[5] Tikhonravov A. V., “Amplitudno-fazovye svoistva spektralnykh koeffitsientov sloistykh sred”, Zh. vychisl. matem. i matem. fiz., 25:3 (1985), 442–450 | MR
[6] Xruslov E. Ya., “Odnomernye obratnye zadachi v elektrodinamike”, Zh. vychisl. matem. i matem. fiz., 25:4 (1985), 548–561 | MR
[7] Zuev I. V., Tikhonravov A. V., “O edinstvennosti opredeleniya parametrov sloistoi sredy po energeticheskomu koeffitsientu otrazheniya”, Zh. vychisl. matem. i matem. fiz., 33:3 (1993), 428–438 | MR
[8] Klibanov M. V., Sacks P. E., Tikhonravov A. V., “The phase retrieval problem. Topical review”, Inverse Problems, 111 (1995), 1–28 | DOI | MR
[9] Furman Sh. A., Tikhonravov A. V., Basics of optics of multilayer systems, Editions Frontieres, Gif-sur-Yvette, 1992
[10] Levin B. Ya., Raspredelenie kornei tselykh funktsii, Gostekhteorizdat, M., 1956