Investigation of localized electromagnetic field in a subwave-length metallic slit
Proceedings of the Yerevan State University. Physical and mathematical sciences, Tome 51 (2017) no. 3, pp. 269-274

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Electromagnetic field localization in a subwavelength metallic slit by a thermo-elastic optical indicator microscope (TEOIM) was investigated. As an indicator for the TEOIM system a slide glass with sizes of $20\times20\times0.5 (mm)$ was used, on the surface of which an Al film of $20~nm$ thickness was vaporized using the vacuum evaporation technique, with various slit width ($10-50~µm$). Strongly localized electromagnetic field has been exited in the slits by $50~ GHz$ generator and was visualized by a TEOIM. The waveguide properties of the system were characterized by COMSOL Multiphysics$^\circledR$ additionally. The simulation results are in good agreement with the visualization data set.
Keywords: subwavelength metallic slit, thermo-elasticity, visualization, field localization.
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     author = {Sh. Kh. Arakelyan},
     title = {Investigation of localized electromagnetic field in a subwave-length metallic slit},
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Sh. Kh. Arakelyan. Investigation of localized electromagnetic field in a subwave-length metallic slit. Proceedings of the Yerevan State University. Physical and mathematical sciences, Tome 51 (2017) no. 3, pp. 269-274. http://geodesic.mathdoc.fr/item/UZERU_2017_51_3_a10/