Geodesic
Method for measuring thickness of thin objects with a nanometer resolution, based on the single-layer flat-coil-oscillator method
Proceedings of the Yerevan State University. Physical and mathematical sciences, no. 3 (2010), pp. 63-67

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A method for measuring of any composition films and tapes thickness with a nanometer resolution is suggested and validated experimentally. That operates on the base of a single-layer flat-coil-oscillator technique. A laboratory prototype of a device is designed and created, based on this method. Besides, PC operation in a "NI LabVIEW" software environment, as well as preliminary tests and calibration of the created device is implemented. It may find variety of applications in a research and in high-tech technology.
Keywords: single-layer Flat-Coil-Oscillator method, a nanometer resolution thickness measuring and controlling technique, high-$T_c$ superconductive films and tapes. 
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     author = {S. G. Gevorgyan and S. T. Muradyan and M. H. Azaryan and G. H. Karapetyan},
     title = {Method for measuring thickness of thin objects with a nanometer resolution, based on the single-layer flat-coil-oscillator method},
     journal = {Proceedings of the Yerevan State University. Physical and mathematical sciences},
     pages = {63--67},
     publisher = {mathdoc},
     number = {3},
     year = {2010},
     language = {en},
     url = {http://geodesic.mathdoc.fr/item/UZERU_2010_3_a8/}
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S. G. Gevorgyan; S. T. Muradyan; M. H. Azaryan; G. H. Karapetyan. Method for measuring thickness of thin objects with a nanometer resolution, based on the single-layer flat-coil-oscillator method. Proceedings of the Yerevan State University. Physical and mathematical sciences, no. 3 (2010), pp. 63-67. http://geodesic.mathdoc.fr/item/UZERU_2010_3_a8/