Geodesic
Imaging of the grain structure of thin HTS film by a single-layer flat-coil-oscillator test-method (SFCO-technique)
Proceedings of the Yerevan State University. Physical and mathematical sciences, no. 2 (2009), pp. 50-54.

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An imaging technique has been created (using a focused $\mathrm{He-Ne}$ laser beam as a probing signal) capable of imaging the grain structure of HTS thin films with $2-3 \ \mu m$ spatial resolution. It is based on detection of an inductance change of a single-layer flat pick-up coil, placed at the face of the specimen. This leads to frequency changes of a stable tunnel diode oscillator. Test device enabled $2D$-mapping of the grain structure of the bridge-shaped $\mathrm{YBaCuO}$ film. Basically, the method is capable of imaging fine peculiarities of normal-metallic to superconductive phase transition and $2D$-current distribution, as well as may identify localized defects in thin HTS-materials with sub-$\mu$ spatial resolution, using non-bolometric response. However, the achieved $2-3 \ \mu m$ resolution of a bolometric nature (in a given device with $3 mm$-size coil) is limited and depends on how narrow is possible to focus the probing beam, while the own spatial resolution of the tested flat-coil technique is better than $0.1 ~\mu m$, and can be improved by $1-2$ orders of the value by reducing pick-up coil size.
Keywords: single-layer flat-coil-oscillator, SFCO, low temperature, laser scanning microscope, LTS, HTS, imaging. 
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     title = {Imaging of the grain structure of thin {HTS} film by a single-layer flat-coil-oscillator test-method {(SFCO-technique)}},
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S. G. Gevorgyan; H. G. Shirinyan; G. A. Karapetyan; G. S. Gevorgyan; A. A. Polyanskii. Imaging of the grain structure of thin HTS film by a single-layer flat-coil-oscillator test-method (SFCO-technique). Proceedings of the Yerevan State University. Physical and mathematical sciences, no. 2 (2009), pp. 50-54. http://geodesic.mathdoc.fr/item/UZERU_2009_2_a8/

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