Formation, structural and morphological properties of thin films of Cu-Sn-Ni precursors
Problemy fiziki, matematiki i tehniki, no. 1 (2023), pp. 38-42.

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The results of the formation of Cu-Sn-Ni precursors by electrochemical deposition on glass substrates with a molybdenum sublayer are presented. The structural and morphological properties of precursors have been studied. The X-ray diffraction patterns showed characteristics of CuSn hexagonal phase, CuNi cubic phase, Ni$_3$Sn cubic phase, and Ni cubic phase. The peaks corresponding to the substrate material, molybdenum, were also found on the X-ray diffraction pattern of the precursors.
Keywords: thin films, Cu$_2$NiSn(S,Se)$_4$, surface morphology, X-ray phase analysis.
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T. N. Osmolovskaya; A. A. Feschenko; A. V. Stanchik. Formation, structural and morphological properties of thin films of Cu-Sn-Ni precursors. Problemy fiziki, matematiki i tehniki, no. 1 (2023), pp. 38-42. http://geodesic.mathdoc.fr/item/PFMT_2023_1_a5/

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