Structure of Co/Pd thin films with perpendicular magnetic anisotropy

A. A. Maximenko

Problemy fiziki, matematiki i tehniki, no. 2 (2018), pp. 11-20.

Résumé

We investigate the effects of annealing and presence of the Pd buffer sublayer on the modifications of interfaces and crystal structure of multilayered Co/Pd thin films deposited by the thermal evaporation method and with the thicknesses of Co 0.2–0.4 nm and Pd 0.6–1.0 nm at which one can expect the maximum magnetic anisotropy.

Détail

Keywords: Co/Pd thin films, perpendicular magnetic anisotropy, interfaces of multilayered thin films, crystal structure of thin films, X-ray reflectivity, thin films analysis by X-ray diffraction, X-ray diffraction of thin films with inclination of diffraction vector with respect to the surface normal.

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