Geodesic
Structure of Co/Pd thin films with perpendicular magnetic anisotropy
Problemy fiziki, matematiki i tehniki, no. 2 (2018), pp. 11-20

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We investigate the effects of annealing and presence of the Pd buffer sublayer on the modifications of interfaces and crystal structure of multilayered Co/Pd thin films deposited by the thermal evaporation method and with the thicknesses of Co 0.2–0.4 nm and Pd 0.6–1.0 nm at which one can expect the maximum magnetic anisotropy.
Keywords: Co/Pd thin films, perpendicular magnetic anisotropy, interfaces of multilayered thin films, crystal structure of thin films, X-ray reflectivity, thin films analysis by X-ray diffraction, X-ray diffraction of thin films with inclination of diffraction vector with respect to the surface normal. 
@article{PFMT_2018_2_a1,
     author = {A. A. Maximenko},
     title = {Structure of {Co/Pd} thin films with perpendicular magnetic anisotropy},
     journal = {Problemy fiziki, matematiki i tehniki},
     pages = {11--20},
     publisher = {mathdoc},
     number = {2},
     year = {2018},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/PFMT_2018_2_a1/}
}
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A. A. Maximenko. Structure of Co/Pd thin films with perpendicular magnetic anisotropy. Problemy fiziki, matematiki i tehniki, no. 2 (2018), pp. 11-20. http://geodesic.mathdoc.fr/item/PFMT_2018_2_a1/