Voir la notice de l'article provenant de la source Math-Net.Ru
@article{PFMT_2015_3_a5, author = {N. I. Staskov and S. O. Parashkov and A. V. Shylov and N. A. Krekoten}, title = {Analytical solution of the inverse problem of a spectrophotometer absorbing layer on an absorbing substrate with a dielectric layer}, journal = {Problemy fiziki, matematiki i tehniki}, pages = {33--37}, publisher = {mathdoc}, number = {3}, year = {2015}, language = {ru}, url = {http://geodesic.mathdoc.fr/item/PFMT_2015_3_a5/} }
TY - JOUR AU - N. I. Staskov AU - S. O. Parashkov AU - A. V. Shylov AU - N. A. Krekoten TI - Analytical solution of the inverse problem of a spectrophotometer absorbing layer on an absorbing substrate with a dielectric layer JO - Problemy fiziki, matematiki i tehniki PY - 2015 SP - 33 EP - 37 IS - 3 PB - mathdoc UR - http://geodesic.mathdoc.fr/item/PFMT_2015_3_a5/ LA - ru ID - PFMT_2015_3_a5 ER -
%0 Journal Article %A N. I. Staskov %A S. O. Parashkov %A A. V. Shylov %A N. A. Krekoten %T Analytical solution of the inverse problem of a spectrophotometer absorbing layer on an absorbing substrate with a dielectric layer %J Problemy fiziki, matematiki i tehniki %D 2015 %P 33-37 %N 3 %I mathdoc %U http://geodesic.mathdoc.fr/item/PFMT_2015_3_a5/ %G ru %F PFMT_2015_3_a5
N. I. Staskov; S. O. Parashkov; A. V. Shylov; N. A. Krekoten. Analytical solution of the inverse problem of a spectrophotometer absorbing layer on an absorbing substrate with a dielectric layer. Problemy fiziki, matematiki i tehniki, no. 3 (2015), pp. 33-37. http://geodesic.mathdoc.fr/item/PFMT_2015_3_a5/
[1] V. V. Filippov, “Analiticheskii metod opredeleniya opticheskikh postoyannykh i tolschiny pogloschayuschikh plenok po spektram otrazheniya”, Optika i spektroskopiya, 78:5 (1995), 798–801
[2] D. Minkov, “Computation of the optical constants of a thin dielectric layer on a transmitting substrate from the reflection spectrum it inclined incidence of light”, JOSA A, 8:2 (1991), 306–310 | DOI
[3] B. M. Komrakov, B. A. Shapochkin, Izmerenie parametrov opticheskikh pokrytii, Mashinostroenie, M., 1986, 136 pp.
[4] P. S. Kosobutskii, “Analiticheskie funktsii ogibayuschikh spektrov Fabri–Pero mnogosloinykh struktur”, Pisma v ZhTF, 34:10 (2008), 79–82
[5] V. V. Filippov, “Metod ogibayuschikh dlya issledovaniya sistemy dvukh plenok na otrazhayuschei podlozhke”, Optika i spektroskopiya, 101:3 (2006), 485–489
[6] M. Born, E. Volf, Osnovy optiki, per. s angl., Nauka, M., 1970, 856 pp.
[7] N. I. Staskov, I. V. Ivashkevich, N. A. Krekoten, “Ellipsometriya perekhodnykh sloev poluprovodnik-dielektrik”, Problemy fiziki, matematiki i tekhniki, 2013, no. 2(15), 18–24
[8] A. I. Belyaeva, A. A. Galuza, S. N. Kolomiets, “Granitsy razdela sloev i sherokhovatost v mnogosloinoi kremnievoi strukture”, Fizika i tekhnika poluprovodnikov, 38:9 (2004), 1050–1055
[9] N. I. Staskov, I. V. Ivashkevich, “Modelirovanie perekhodnykh sloev v strukture poluprovodnik-dielektrik-poluprovodnik”, Optika neodnorodnykh struktur, Materialy III mezhdunar. nauch.-prakt. konf. (Mogilev, 2011 g.), ed. V. A. Karpenko, MGU im. A. A. Kuleshova, Mogilev, 2011, 92–94