Modified Hotelling's chart excluding trend influence and its application for digital watermarks detection
Prikladnaâ diskretnaâ matematika, no. 2 (2010), pp. 42-58.

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A modified Hotelling's $T^2$-statistics is suggested for application in control charts in order to exclude trend influence. Also, a method of using control charts for digital watermarks detection is discussed.
Keywords: computer security, digital watermarks, control charts method.
@article{PDM_2010_2_a5,
     author = {B. B. Borisenko},
     title = {Modified {Hotelling's} chart excluding trend influence and its application for digital watermarks detection},
     journal = {Prikladna\^a diskretna\^a matematika},
     pages = {42--58},
     publisher = {mathdoc},
     number = {2},
     year = {2010},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/PDM_2010_2_a5/}
}
TY  - JOUR
AU  - B. B. Borisenko
TI  - Modified Hotelling's chart excluding trend influence and its application for digital watermarks detection
JO  - Prikladnaâ diskretnaâ matematika
PY  - 2010
SP  - 42
EP  - 58
IS  - 2
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/PDM_2010_2_a5/
LA  - ru
ID  - PDM_2010_2_a5
ER  - 
%0 Journal Article
%A B. B. Borisenko
%T Modified Hotelling's chart excluding trend influence and its application for digital watermarks detection
%J Prikladnaâ diskretnaâ matematika
%D 2010
%P 42-58
%N 2
%I mathdoc
%U http://geodesic.mathdoc.fr/item/PDM_2010_2_a5/
%G ru
%F PDM_2010_2_a5
B. B. Borisenko. Modified Hotelling's chart excluding trend influence and its application for digital watermarks detection. Prikladnaâ diskretnaâ matematika, no. 2 (2010), pp. 42-58. http://geodesic.mathdoc.fr/item/PDM_2010_2_a5/

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