Path delay fault classification
Prikladnaâ diskretnaâ matematika, no. 10 (2009), pp. 68-69
Citer cet article
Voir la notice de l'article provenant de la source Math-Net.Ru
A path delay fault classification based on equivalent normal form (e. n. f.) analysis is suggested. The conditions of robust, non-robust and functional fault manifestation for combinational circuit are formulated. A justification of path delay fault masking is given.
[1] Devadas\;S., Keitzer\;K., “Synthesis of Robust Delay Delay-Fault-Testable Circuits: Theory”, IEEE Transactions on Computer-Aided Design, 11:1 (1992), 87–101, January | DOI