Geodesic
Similation by Monte-Carlo method of electron transport in cristalline dielectrics charged under irradiation
Matematičeskoe modelirovanie, Tome 20 (2008) no. 6, pp. 79-85 
V. S. Kortov; S. V. Zvonarev. Similation by Monte-Carlo method of electron transport in cristalline dielectrics charged under irradiation. Matematičeskoe modelirovanie, Tome 20 (2008) no. 6, pp. 79-85. http://geodesic.mathdoc.fr/item/MM_2008_20_6_a7/
@article{MM_2008_20_6_a7,
     author = {V. S. Kortov and S. V. Zvonarev},
     title = {Similation by {Monte-Carlo} method of electron transport in cristalline dielectrics charged under irradiation},
     journal = {Matemati\v{c}eskoe modelirovanie},
     pages = {79--85},
     year = {2008},
     volume = {20},
     number = {6},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/MM_2008_20_6_a7/}
}
TY  - JOUR
AU  - V. S. Kortov
AU  - S. V. Zvonarev
TI  - Similation by Monte-Carlo method of electron transport in cristalline dielectrics charged under irradiation
JO  - Matematičeskoe modelirovanie
PY  - 2008
SP  - 79
EP  - 85
VL  - 20
IS  - 6
UR  - http://geodesic.mathdoc.fr/item/MM_2008_20_6_a7/
LA  - ru
ID  - MM_2008_20_6_a7
ER  - 
%0 Journal Article
%A V. S. Kortov
%A S. V. Zvonarev
%T Similation by Monte-Carlo method of electron transport in cristalline dielectrics charged under irradiation
%J Matematičeskoe modelirovanie
%D 2008
%P 79-85
%V 20
%N 6
%U http://geodesic.mathdoc.fr/item/MM_2008_20_6_a7/
%G ru
%F MM_2008_20_6_a7

Voir la notice de l'article provenant de la source Math-Net.Ru

Based on physical processes a mathematical model and a calculation algorithm of the electron transport in crystalline dielectrics charged under irradiation are developed. The model was approved for calculation of physical processes taking place in charged thin layers SiO2 under the electron bombardment. The results of calculation are in agreement with the experimental data and physical representation that suggest adequacy of proposed model.

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