Geodesic
Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies
Žurnal Sibirskogo federalʹnogo universiteta. Matematika i fizika, Tome 10 (2017) no. 2, pp. 223-232.

Voir la notice de l'article provenant de la source Math-Net.Ru

An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model of ferromagnetic reflective films is in focus. The obtained algorithm can be used to control optical and magneto-optical properties during films growth inside vacuum chambers.
Keywords: magneto-optical ellipsometry, two-layer model, ferromagnetic metal, reflection, growth control.
Mots-clés : Kerr effect 
@article{JSFU_2017_10_2_a9,
     author = {Olga A. Maksimova and Sergey G. Ovchinnikov and Nikolay N. Kosyrev and Sergey A. Lyaschenko},
     title = {Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies},
     journal = {\v{Z}urnal Sibirskogo federalʹnogo universiteta. Matematika i fizika},
     pages = {223--232},
     publisher = {mathdoc},
     volume = {10},
     number = {2},
     year = {2017},
     language = {en},
     url = {http://geodesic.mathdoc.fr/item/JSFU_2017_10_2_a9/}
}
TY  - JOUR
AU  - Olga A. Maksimova
AU  - Sergey G. Ovchinnikov
AU  - Nikolay N. Kosyrev
AU  - Sergey A. Lyaschenko
TI  - Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies
JO  - Žurnal Sibirskogo federalʹnogo universiteta. Matematika i fizika
PY  - 2017
SP  - 223
EP  - 232
VL  - 10
IS  - 2
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/JSFU_2017_10_2_a9/
LA  - en
ID  - JSFU_2017_10_2_a9
ER  - 
%0 Journal Article
%A Olga A. Maksimova
%A Sergey G. Ovchinnikov
%A Nikolay N. Kosyrev
%A Sergey A. Lyaschenko
%T Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies
%J Žurnal Sibirskogo federalʹnogo universiteta. Matematika i fizika
%D 2017
%P 223-232
%V 10
%N 2
%I mathdoc
%U http://geodesic.mathdoc.fr/item/JSFU_2017_10_2_a9/
%G en
%F JSFU_2017_10_2_a9
Olga A. Maksimova; Sergey G. Ovchinnikov; Nikolay N. Kosyrev; Sergey A. Lyaschenko. Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies. Žurnal Sibirskogo federalʹnogo universiteta. Matematika i fizika, Tome 10 (2017) no. 2, pp. 223-232. http://geodesic.mathdoc.fr/item/JSFU_2017_10_2_a9/

[1] N. V. Volkov et al., “Magnetic-field- and bias-sensitive conductivity of a hybrid $Fe/SiO_{2}/p$-$Si$ structure in planar geometry”, J. Appl. Phys., 109 (2011), 123924 | DOI

[2] K. Mok et al., “Thickness independent magneto-optical coupling constant of nickel films in the visible spectral range”, Rev. Sci. Instrum., 82 (2011), 033112 | DOI

[3] K. Mok et al., “Vector-magneto-optical generalized ellipsometry”, J. Appl. Phys., 110 (2011), 123110 | DOI

[4] K. Mok et al., “Magneto-optical coupling in ferromagnetic thin films investigated by vector-magneto-optical generalized ellipsometry”, Phys. Rev. B, 84 (2011), 094413 | DOI

[5] G. Neuber et al., “Temperature-dependent spectral generalized magneto-optical ellipsometry for ferromagnetic compounds”, Rev. Sci. Instrum., 76 (2005), 023910 | DOI

[6] Š. Višňovský, “Magneto-optical ellipsometry”, Czech. J. Phys. B, 36 (1986), 625–650 | DOI

[7] R. M. A. Azzam, N. M. Bashara, Elipsometry and polirilized light, North Holland Publishing Company, New York, 1977

[8] H. Fujiwara, Spectroscopic Ellipsometry Principles and Applications, John Wiley Sons, Chichester, 2007

[9] O. A. Maximova et al., “Magnetic contribution to Fresnel coefficients at magneto-ellipsometric investigation”, Vestnik SibGAU, 49:3 (2013), 212–217

[10] O. A. Maximova et al., “Features of the ellipsometric investigation of magnetic nanostructures”, Journal of Structural Chemistry, 55:6 (1964), 1134–1141 | DOI

[11] O. A. Maximova et al., “In situ magneto-optical ellipsometry data analysis for films growth control”, JMMM (Available online 20 December 2016) | DOI

[12] I. A. Tarasov et al., “Quick ellipsometric technique for determining the thicknesses and optical constant profiles of $Fe/SiO_{2}/Si(100)$ nanostructures during growth”, Tech. Phys., 57:6 (2012), 1225–1229 | DOI

[13] J. A. Nelder, A. D. Mead, “A Simplex Method for Function Minimization”, Computer Journal, 7 (1965), 308–313 | DOI | MR | Zbl