Methods to reduce the scan time of the scanning probe microscope without deterioration of image quality
News of the Kabardin-Balkar scientific center of RAS, no. 2 (2013), pp. 15-22.

Voir la notice de l'article provenant de la source Math-Net.Ru

The control system of scanning probe microscope is an automatic control system with feedback. To increase the speed of such control systems we may, firstly, use the notch filter tuned to the resonance frequency of Z-scanner, and, secondly, by using fast scanning techniques. The paper presents measurements of grating gauge height of 25 nm using fast scanning techniques. It is shown that the developed scanning techniques provide more than double increase in scan rate with the same image quality.
Keywords: control system, scanning probe microscope, scanning techniques, notch filter.
@article{IZKAB_2013_2_a2,
     author = {B. B. Meshcheryakov and V. V. Maslennikov and {\CYRA}. {\CYRV}. Meshcheryakov},
     title = {Methods to reduce the scan time of the scanning probe microscope without deterioration of image quality},
     journal = {News of the Kabardin-Balkar scientific center of RAS},
     pages = {15--22},
     publisher = {mathdoc},
     number = {2},
     year = {2013},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/IZKAB_2013_2_a2/}
}
TY  - JOUR
AU  - B. B. Meshcheryakov
AU  - V. V. Maslennikov
AU  - А. В. Meshcheryakov
TI  - Methods to reduce the scan time of the scanning probe microscope without deterioration of image quality
JO  - News of the Kabardin-Balkar scientific center of RAS
PY  - 2013
SP  - 15
EP  - 22
IS  - 2
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/IZKAB_2013_2_a2/
LA  - ru
ID  - IZKAB_2013_2_a2
ER  - 
%0 Journal Article
%A B. B. Meshcheryakov
%A V. V. Maslennikov
%A А. В. Meshcheryakov
%T Methods to reduce the scan time of the scanning probe microscope without deterioration of image quality
%J News of the Kabardin-Balkar scientific center of RAS
%D 2013
%P 15-22
%N 2
%I mathdoc
%U http://geodesic.mathdoc.fr/item/IZKAB_2013_2_a2/
%G ru
%F IZKAB_2013_2_a2
B. B. Meshcheryakov; V. V. Maslennikov; А. В. Meshcheryakov. Methods to reduce the scan time of the scanning probe microscope without deterioration of image quality. News of the Kabardin-Balkar scientific center of RAS, no. 2 (2013), pp. 15-22. http://geodesic.mathdoc.fr/item/IZKAB_2013_2_a2/

[1] T. Sulchek, G. G. Yaralioglu, C. F. Quate, “Characterization and optimization of scan speed for tapping-mode atomic force microscopy”, Review of Scientific Instruments, 73:8 (2002), 2928–2936 | DOI

[2] N. Kodera, M. Sakashita, “Dynamic proportional-integral-differential controller for highspeed atomic force microscopy”, Review of Scientific Instruments, 77:8 (2006), 083704-1-083704-6 | DOI

[3] B. Orun, S. Necipoglu, C. Basdogan, L. Guvenc, “State feedback control for adjusting the dynamic behavior of a piezoactuated bimorph atomic force microscopy probe”, Review of Scientific Instruments, 80 (2009), 063701-1-063701-7 | DOI

[4] P. Agarwal, T. De, M. V. Salapaka, “Real time of probe-loss using switching gain controller for high speed atomic force microscopy”, Review of Scientific Instruments, 80:10 (2009), 103701-1-103701-5 | DOI

[5] V. V. Mescheryakov, V. V. Maslennikov, A. V. Mescheryakov, “Metody povysheniya bystrodeistviya skaniruyuschego zondovogo mikroskopa”, Datchiki i sistemy, 2012, no. 11, 40–44

[6] V. V. Meshtcheryakov, A. V. Meshtcheryakov, “Scan speed control for tapping mode SPM”, Nanoscale Research Letters, 7:1 (2012), 121–125 | DOI

[7] A. J. Fleming, B. J. Kenton, K. K. Leang, “Bridging the gap between conventional and videospeed scanning probe microscopes”, Ultramicroscopy, 110:9 (2010), 1205–1214 | DOI

[8] M. W. Fairbairn, S. O.R. Moheimani, “A switched gain resonant controller to minimize image artifacts in intermittent contact mode atomic force microscopy”, IEEE Transactions on Nanotechnology, 11:6 (2012), 1126–1134 | DOI

[9] M. W. Fairbairn, S. O.R. Moheimani, “Resonant control of an atomic force microscope micro-cantilever for active Q control”, Review of Scientific Instruments, 83:8 (2012), 083708-1-083708-9 | DOI

[10] Y. Zhang, Y. Fang, J. Yu, X. Dong, “Note: a novel atomic force microscope fast imaging approach: variable-speed scanning”, Review of Scientific Instruments, 82:5 (2011), 056103-1-056103-4 | DOI

[11] D. Zhang, X. Qian, “Adaptive scanning scaning in atomic force microscopy”, 2009 IEEE International Conference on Robotics and Automation (Kobe, Japan, May 2009), 532–537 | DOI

[12] D. Y. Abramovitch, S. Hoen, R. Workman, “Semi-automatic tuning of PID gains for atomic force microscopes”, American Control Conference (Seattle, WA, June 2008), 2684–2689 | MR

[13] Devasia S. A survey of control, “Issues in nanopositioning”, IEEE Transactions on Control Systems Technology, 15:5 (2007), 809–817 | DOI | MR

[14] V. V. Mescheryakov, V. V. Maslennikov, A. V. Mescheryakov, “K voprosu o sinteze tsifrovykh minimalno-fazovykh rezhektornykh KIKh-filtrov”, Trudy Rossiiskogo nauchno-tekhnicheskogo obschestva radiotekhniki, elektroniki i svyazi imeni A.S. Popova, Sbornik dokladov (16-17 maya 2012), M., 319–322 | MR

[15] http://ntmdt.ru

[16] S. S. Useinov, V. V. Solovev, K. V. Gogolinskii, A. S. Useinov, N. A. Lvova, “Izmerenie mekhanicheskikh svoistv materialov s nanometrovym prostranstvennym razresheniem”, Nanoindustriya, 2010, no. 2, 46–50