Geodesic
Hash functions for diagnostic information reduction
Izvestiya of Saratov University. Mathematics. Mechanics. Informatics, Tome 7 (2007) no. 2, pp. 76-81 
V. B. Goldshteyn; S. V. Mironov. Hash functions for diagnostic information reduction. Izvestiya of Saratov University. Mathematics. Mechanics. Informatics, Tome 7 (2007) no. 2, pp. 76-81. http://geodesic.mathdoc.fr/item/ISU_2007_7_2_a15/
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Voir la notice de l'article provenant de la source Math-Net.Ru

In this paper we present a new approach for the solution of problem of the diagnostic information reduction. This approach is based on use of hash functions delivering a compact signature for records in a fault dictionary. The experimental results show a considerable decrease in the storage requirement of diagnostic information reduced with the help of such functions.

[1] Abramovici M., Breuer M. A., Friedman A. D., Digital Systems Testing and Testable Design, Computer Science Press Inc., N.Y., 1996

[2] Ryan P. G., Rawat S., Fuchs W. K., “Two-stage fault location”, Proc. of International Test Conf., 1991, 963–968

[3] Boppana V., Hartanto I., Fuchs W. K., “Full fault dictionary storage based on labeled tree encoding”, Proc. of 14th VLSI Test Symposium, 1996, 174–179

[4] Pomeranz I., Reddy S. M., “On the generation of small dictionaries for fault location”, Proc. of the 1992 IEEE/ACM International Conf. on Computer-Aided design (ICCAD'92), 1992, 272–279

[5] Ryan P. G., Fuchs W. K., Pomeranz I., “Fault dictionary compression and equivalence class computation for sequential circuits”, Proc. of IEEE International Conf. on Computer-Aided Design (ICCAD'93), 1993, 508–511

[6] Chess B., Larrabee T., “Creating small fault dictionaries”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 18:3 (1999), 346–356 | DOI

[7] Arslan B., Orailoglu A., “Fault dictionary size reduction through test response superposition”, Proc. of the 2002 IEEE International Conf. on Computer Design: VLSI in Computers (ICCD'02), 2002, 480–485

[8] Speranskii D. V., “Ob odnom podkhode k resheniyu zadach sokrascheniya ob'ema diagnosticheskoi informatsii”, Avtomatika i telemekhanika, 1984, no. 3, 151–160

[9] Barashko A. S., Skobtsov Yu. A., Speranskii D. V., Modelirovanie i testirovanie diskretnykh ustroistv, Nauk. dumka, Kiev, 1992 | MR

[10] Akho A., Khopkroft Dzh., Ulman Dzh., Struktury dannykh i algoritmy, Izd. dom “Vilyams”, M., 2003

[11] Karmen T., Leizerson Ch., Rivest R., Algoritmy, postroenie i analiz, MTsNMO, M., 2002

[12] Niermann T., Patel J., “HITEC: a test generation package for sequential circuits”, Proc. European Design Automation Conf., 1991, 214–218

[13] Zakrevskii A. D., Pottosin Yu. V., Cheremisinova L. D., Osnovy logicheskogo proektirovaniya. Kn. 1. Kombinatornye algoritmy diskretnoi matematiki, OIPI NAN Belarusi, Minsk, 2004