Geodesic
Some classes of easily testable circuits in the Zhegalkin basis
Diskretnaya Matematika, Tome 33 (2021) no. 4, pp. 3-10

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We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained.
Keywords: circuit of gates, constant faults, fault detection test, Zhegalkin basis. 
Yu. V. Borodina. Some classes of easily testable circuits in the Zhegalkin basis. Diskretnaya Matematika, Tome 33 (2021) no. 4, pp. 3-10. http://geodesic.mathdoc.fr/item/DM_2021_33_4_a0/
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