Geodesic
Some classes of easily testable circuits in the Zhegalkin basis
Diskretnaya Matematika, Tome 33 (2021) no. 4, pp. 3-10

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We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained.
Keywords: circuit of gates, constant faults, fault detection test, Zhegalkin basis. 
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     author = {Yu. V. Borodina},
     title = {Some classes of easily testable circuits in the {Zhegalkin} basis},
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     url = {http://geodesic.mathdoc.fr/item/DM_2021_33_4_a0/}
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Yu. V. Borodina. Some classes of easily testable circuits in the Zhegalkin basis. Diskretnaya Matematika, Tome 33 (2021) no. 4, pp. 3-10. http://geodesic.mathdoc.fr/item/DM_2021_33_4_a0/