Geodesic
On reliability of circuits over the bases $\{\sim,\,\oplus\}$, $\{\sim,\,0\}$, $\{\oplus,\,1\}$, $\{\oplus,\vee,1\}$ in the case of faults of type 0 at the outputs of elements
Diskretnaya Matematika, Tome 21 (2009) no. 2, pp. 102-111 
M. A. Alekhina. On reliability of circuits over the bases $\{\sim,\&,\oplus\}$, $\{\sim,\&,0\}$, $\{\oplus,\&,1\}$, $\{\oplus,\vee,1\}$ in the case of faults of type 0 at the outputs of elements. Diskretnaya Matematika, Tome 21 (2009) no. 2, pp. 102-111. http://geodesic.mathdoc.fr/item/DM_2009_21_2_a6/
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Voir la notice de l'article provenant de la source Math-Net.Ru

In the case of faults of type 0 at the outputs of elements, it is proved that in the bases $\{\sim,\,\oplus\}$, $\{\sim,\,0\}$, $\{\oplus,\,1\}$, $\{\oplus,\vee,1\}$ almost all Boolean functions can be realised by asymptotically best (optimal) with respect to the reliability circuits functioning with unreliability $P(S)\sim\gamma$ as $\gamma\to0$, where $\gamma$ is the probability of the faulty state of an element.

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