Doklady Akademii Nauk, Tome 320 (1991) no. 2, pp. 334-338
Citer cet article
O. V. Konovalov; L. A. Feigin. On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers. Doklady Akademii Nauk, Tome 320 (1991) no. 2, pp. 334-338. http://geodesic.mathdoc.fr/item/DAN_1991_320_2_a14/
@article{DAN_1991_320_2_a14,
author = {O. V. Konovalov and L. A. Feigin},
title = {On the {X-ray} reflectometry technique of the structure determination of {Langmuir{\textendash}Blodgett} films with a small amount of layers},
journal = {Doklady Akademii Nauk},
pages = {334--338},
year = {1991},
volume = {320},
number = {2},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/DAN_1991_320_2_a14/}
}
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AU - O. V. Konovalov
AU - L. A. Feigin
TI - On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers
JO - Doklady Akademii Nauk
PY - 1991
SP - 334
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