Geodesic
On the X-ray reflectometry technique of the structure determination of Langmuir--Blodgett films with a small amount of layers
Doklady Akademii Nauk, Tome 320 (1991) no. 2, pp. 334-338.

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     author = {O. V. Konovalov and L. A. Feigin},
     title = {On the {X-ray} reflectometry technique of the structure determination of {Langmuir--Blodgett} films with a small amount of layers},
     journal = {Doklady Akademii Nauk},
     pages = {334--338},
     publisher = {mathdoc},
     volume = {320},
     number = {2},
     year = {1991},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DAN_1991_320_2_a14/}
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O. V. Konovalov; L. A. Feigin. On the X-ray reflectometry technique of the structure determination of Langmuir--Blodgett films with a small amount of layers. Doklady Akademii Nauk, Tome 320 (1991) no. 2, pp. 334-338. http://geodesic.mathdoc.fr/item/DAN_1991_320_2_a14/