Doklady Akademii Nauk, Tome 307 (1989) no. 4, pp. 840-844
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S. K. Likharev; E. I. Rau; V. P. Trifonenkov; A. G. Yagola. Microtomography of semiconductor structure in the regime of induced current. Doklady Akademii Nauk, Tome 307 (1989) no. 4, pp. 840-844. http://geodesic.mathdoc.fr/item/DAN_1989_307_4_a16/
@article{DAN_1989_307_4_a16,
author = {S. K. Likharev and E. I. Rau and V. P. Trifonenkov and A. G. Yagola},
title = {Microtomography of semiconductor structure in the regime of induced current},
journal = {Doklady Akademii Nauk},
pages = {840--844},
year = {1989},
volume = {307},
number = {4},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/DAN_1989_307_4_a16/}
}
TY - JOUR
AU - S. K. Likharev
AU - E. I. Rau
AU - V. P. Trifonenkov
AU - A. G. Yagola
TI - Microtomography of semiconductor structure in the regime of induced current
JO - Doklady Akademii Nauk
PY - 1989
SP - 840
EP - 844
VL - 307
IS - 4
UR - http://geodesic.mathdoc.fr/item/DAN_1989_307_4_a16/
LA - ru
ID - DAN_1989_307_4_a16
ER -
%0 Journal Article
%A S. K. Likharev
%A E. I. Rau
%A V. P. Trifonenkov
%A A. G. Yagola
%T Microtomography of semiconductor structure in the regime of induced current
%J Doklady Akademii Nauk
%D 1989
%P 840-844
%V 307
%N 4
%U http://geodesic.mathdoc.fr/item/DAN_1989_307_4_a16/
%G ru
%F DAN_1989_307_4_a16
