Doklady Akademii Nauk, Tome 156 (1964) no. 6, pp. 1339-1340
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V. N. Rozhanskii; G. V. Berezhkova. Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations. Doklady Akademii Nauk, Tome 156 (1964) no. 6, pp. 1339-1340. http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/
@article{DAN_1964_156_6_a22,
author = {V. N. Rozhanskii and G. V. Berezhkova},
title = {Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations},
journal = {Doklady Akademii Nauk},
pages = {1339--1340},
year = {1964},
volume = {156},
number = {6},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/}
}
TY - JOUR
AU - V. N. Rozhanskii
AU - G. V. Berezhkova
TI - Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
JO - Doklady Akademii Nauk
PY - 1964
SP - 1339
EP - 1340
VL - 156
IS - 6
UR - http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/
LA - ru
ID - DAN_1964_156_6_a22
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%A V. N. Rozhanskii
%A G. V. Berezhkova
%T Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
%J Doklady Akademii Nauk
%D 1964
%P 1339-1340
%V 156
%N 6
%U http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/
%G ru
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