Geodesic
Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
Doklady Akademii Nauk, Tome 156 (1964) no. 6, pp. 1339-1340.

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     author = {V. N. Rozhanskii and G. V. Berezhkova},
     title = {Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations},
     journal = {Doklady Akademii Nauk},
     pages = {1339--1340},
     publisher = {mathdoc},
     volume = {156},
     number = {6},
     year = {1964},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/}
}
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V. N. Rozhanskii; G. V. Berezhkova. Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations. Doklady Akademii Nauk, Tome 156 (1964) no. 6, pp. 1339-1340. http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/