Geodesic
Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
Doklady Akademii Nauk, Tome 156 (1964) no. 6, pp. 1339-1340 Cet article a éte moissonné depuis la source Math-Net.Ru

Voir la notice de l'article

@article{DAN_1964_156_6_a22,
     author = {V. N. Rozhanskii and G. V. Berezhkova},
     title = {Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations},
     journal = {Doklady Akademii Nauk},
     pages = {1339--1340},
     year = {1964},
     volume = {156},
     number = {6},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/}
}
TY  - JOUR
AU  - V. N. Rozhanskii
AU  - G. V. Berezhkova
TI  - Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
JO  - Doklady Akademii Nauk
PY  - 1964
SP  - 1339
EP  - 1340
VL  - 156
IS  - 6
UR  - http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/
LA  - ru
ID  - DAN_1964_156_6_a22
ER  - 
%0 Journal Article
%A V. N. Rozhanskii
%A G. V. Berezhkova
%T Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations
%J Doklady Akademii Nauk
%D 1964
%P 1339-1340
%V 156
%N 6
%U http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/
%G ru
%F DAN_1964_156_6_a22
V. N. Rozhanskii; G. V. Berezhkova. Electron, microscope diffraction patterns used in measuring the bend of thin ribbon-shaped crystals caused by axial dislocations. Doklady Akademii Nauk, Tome 156 (1964) no. 6, pp. 1339-1340. http://geodesic.mathdoc.fr/item/DAN_1964_156_6_a22/