@article{10_21136_AM_1977_103688,
author = {Rychlik, Zdzis{\l}aw and Szynal, Dominik},
title = {Inflated truncated negative binomial acceptance sampling plan},
journal = {Applications of Mathematics},
pages = {157--165},
year = {1977},
volume = {22},
number = {3},
doi = {10.21136/AM.1977.103688},
mrnumber = {0445762},
zbl = {0369.62013},
language = {en},
url = {http://geodesic.mathdoc.fr/articles/10.21136/AM.1977.103688/}
}
TY - JOUR AU - Rychlik, Zdzisław AU - Szynal, Dominik TI - Inflated truncated negative binomial acceptance sampling plan JO - Applications of Mathematics PY - 1977 SP - 157 EP - 165 VL - 22 IS - 3 UR - http://geodesic.mathdoc.fr/articles/10.21136/AM.1977.103688/ DO - 10.21136/AM.1977.103688 LA - en ID - 10_21136_AM_1977_103688 ER -
%0 Journal Article %A Rychlik, Zdzisław %A Szynal, Dominik %T Inflated truncated negative binomial acceptance sampling plan %J Applications of Mathematics %D 1977 %P 157-165 %V 22 %N 3 %U http://geodesic.mathdoc.fr/articles/10.21136/AM.1977.103688/ %R 10.21136/AM.1977.103688 %G en %F 10_21136_AM_1977_103688
Rychlik, Zdzisław; Szynal, Dominik. Inflated truncated negative binomial acceptance sampling plan. Applications of Mathematics, Tome 22 (1977) no. 3, pp. 157-165. doi: 10.21136/AM.1977.103688
[1] С. A. Cohen: Curtailed attribute sampling. Technometrics 12 (1970), 295-298. | DOI | Zbl
[2] H. Cramér: Mathematical methods of statistics. Princeton Univ. Press, Princeton 1946. | MR
[3] C. C. Craig: The ASN for truncated single and double attribute acceptance sampling plans. ASQC Convention Transactions (1968), 63 - 67.
[4] C. C. Craig: The average sample number for truncated single and double attribute sampling plans. Technometrics 10 (1968), 685-692. | DOI | MR
[5] K. N. Pandey: On generalized inflated Poisson distribution. J. Scient. Res. Banaras Hindu Univ. 15 (1964-1965), 157-162. | MR
[6] G. P. Patil: On the evaluation of the negative binomial distribution with example. Technometrics 2 (1960), 501-505. | DOI | MR
[7] G. P. Patil: Note on the equivalence of the binomial and inverse binomial acceptance sampling plans and an acknowledgement. Technometrics 5 (1963), 119-121. | DOI
[8] A. G. Phatak M. M. Bhatt: Estimation of fraction defective in curtailed sampling plans. Technometrics 9 (1967), 219-228. | DOI | MR
[9] M. P. Singh: Inflated binomial distribution. J. Scient. Res. Banaras Hindu Univ. 16 (1965 to 1966), 87-90.
[10] S. N. Singh: Probability models for the variation in the number of births per couple. J. Am. Statist. Ass. 58 (1972), 721-727. | MR
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