Inflated truncated negative binomial acceptance sampling plan
Applications of Mathematics, Tome 22 (1977) no. 3, pp. 157-165
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This paper gives the maximum likelihood estimations of the process (or lot) average proportion $p$ of defectives and the proportion $(\alpha)$ of the population which follows a negative binomial distribution based on attribute samples that have been curtailed either with the rejection of a lot on finding the $k$th defective or with the acceptance of it on finding the $K$th nondefective. These estimates are based on inspection from a sequence of $m$ lots of inspected items. Moreover, the linear estimates of $p$ and $\alpha$ and the asymptotic variance and covariance of considered estimators are given.
This paper gives the maximum likelihood estimations of the process (or lot) average proportion $p$ of defectives and the proportion $(\alpha)$ of the population which follows a negative binomial distribution based on attribute samples that have been curtailed either with the rejection of a lot on finding the $k$th defective or with the acceptance of it on finding the $K$th nondefective. These estimates are based on inspection from a sequence of $m$ lots of inspected items. Moreover, the linear estimates of $p$ and $\alpha$ and the asymptotic variance and covariance of considered estimators are given.
DOI : 10.21136/AM.1977.103688
Classification : 62D05, 62N10
@article{10_21136_AM_1977_103688,
     author = {Rychlik, Zdzis{\l}aw and Szynal, Dominik},
     title = {Inflated truncated negative binomial acceptance sampling plan},
     journal = {Applications of Mathematics},
     pages = {157--165},
     year = {1977},
     volume = {22},
     number = {3},
     doi = {10.21136/AM.1977.103688},
     mrnumber = {0445762},
     zbl = {0369.62013},
     language = {en},
     url = {http://geodesic.mathdoc.fr/articles/10.21136/AM.1977.103688/}
}
TY  - JOUR
AU  - Rychlik, Zdzisław
AU  - Szynal, Dominik
TI  - Inflated truncated negative binomial acceptance sampling plan
JO  - Applications of Mathematics
PY  - 1977
SP  - 157
EP  - 165
VL  - 22
IS  - 3
UR  - http://geodesic.mathdoc.fr/articles/10.21136/AM.1977.103688/
DO  - 10.21136/AM.1977.103688
LA  - en
ID  - 10_21136_AM_1977_103688
ER  - 
%0 Journal Article
%A Rychlik, Zdzisław
%A Szynal, Dominik
%T Inflated truncated negative binomial acceptance sampling plan
%J Applications of Mathematics
%D 1977
%P 157-165
%V 22
%N 3
%U http://geodesic.mathdoc.fr/articles/10.21136/AM.1977.103688/
%R 10.21136/AM.1977.103688
%G en
%F 10_21136_AM_1977_103688
Rychlik, Zdzisław; Szynal, Dominik. Inflated truncated negative binomial acceptance sampling plan. Applications of Mathematics, Tome 22 (1977) no. 3, pp. 157-165. doi: 10.21136/AM.1977.103688

[1] С. A. Cohen: Curtailed attribute sampling. Technometrics 12 (1970), 295-298. | DOI | Zbl

[2] H. Cramér: Mathematical methods of statistics. Princeton Univ. Press, Princeton 1946. | MR

[3] C. C. Craig: The ASN for truncated single and double attribute acceptance sampling plans. ASQC Convention Transactions (1968), 63 - 67.

[4] C. C. Craig: The average sample number for truncated single and double attribute sampling plans. Technometrics 10 (1968), 685-692. | DOI | MR

[5] K. N. Pandey: On generalized inflated Poisson distribution. J. Scient. Res. Banaras Hindu Univ. 15 (1964-1965), 157-162. | MR

[6] G. P. Patil: On the evaluation of the negative binomial distribution with example. Technometrics 2 (1960), 501-505. | DOI | MR

[7] G. P. Patil: Note on the equivalence of the binomial and inverse binomial acceptance sampling plans and an acknowledgement. Technometrics 5 (1963), 119-121. | DOI

[8] A. G. Phatak M. M. Bhatt: Estimation of fraction defective in curtailed sampling plans. Technometrics 9 (1967), 219-228. | DOI | MR

[9] M. P. Singh: Inflated binomial distribution. J. Scient. Res. Banaras Hindu Univ. 16 (1965 to 1966), 87-90.

[10] S. N. Singh: Probability models for the variation in the number of births per couple. J. Am. Statist. Ass. 58 (1972), 721-727. | MR

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