Geodesic
Method for expanding the object base of examination by stitching solutions of hierarchy analysis method
Vestnik Ûžno-Uralʹskogo gosudarstvennogo universiteta. Seriâ, Matematičeskoe modelirovanie i programmirovanie, Tome 10 (2017) no. 2, pp. 74-82

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The paper presents the results on numerical modelling of the quality of opto-electronic detectors. In order to demonstrate a successful application of the proposed method of the object base extension, we use examples of hierarchy analysis of generalized quality index and integrated quality-price index. The proposed methodology allows reliable analysis the number of objects up to 21–24, that is enough for the most practical cases of examination.
Keywords: hierarchy analysis method; optoelectronic detectors; quality index. 
@article{VYURU_2017_10_2_a5,
     author = {S. V. Bukharin and A. V. Melnikov and V. V. Menshih},
     title = {Method for expanding the object base of examination by stitching solutions of hierarchy analysis method},
     journal = {Vestnik \^U\v{z}no-Uralʹskogo gosudarstvennogo universiteta. Seri\^a, Matemati\v{c}eskoe modelirovanie i programmirovanie},
     pages = {74--82},
     publisher = {mathdoc},
     volume = {10},
     number = {2},
     year = {2017},
     language = {en},
     url = {http://geodesic.mathdoc.fr/item/VYURU_2017_10_2_a5/}
}
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S. V. Bukharin; A. V. Melnikov; V. V. Menshih. Method for expanding the object base of examination by stitching solutions of hierarchy analysis method. Vestnik Ûžno-Uralʹskogo gosudarstvennogo universiteta. Seriâ, Matematičeskoe modelirovanie i programmirovanie, Tome 10 (2017) no. 2, pp. 74-82. http://geodesic.mathdoc.fr/item/VYURU_2017_10_2_a5/