The evolution of a Ti film/silumin substrate system irradiated by a pulse electron beam
Vestnik Ûžno-Uralʹskogo gosudarstvennogo universiteta. Seriâ, Matematika, mehanika, fizika, Tome 16 (2024) no. 3, pp. 50-61

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The electron beam treatment of metal surfaces involves the use of intense pulsed electron beams to improve a wide range of surface properties of different materials. Research has shown that it can lead to a marked reduction in surface roughness and porosity and a marked increase in tensile strength and ductility. Processed samples also have improved hardness, wear resistance, and anti-corrosion properties, which emphasizes the effectiveness of electron beam surface treatment in materials science. This work studies the irradiation of a Ti film/silumin substrate system showing it leads to the transformation of both the Ti film and the silumin layer with different energy densities, which has a different effect on the structure and composition. When treated with an electron beam at an energy density of 30 J/cm$^2$, the Ti film and the silumin layer undergo complete dissolution, resulting in a complex submicron crystalline structure characterized by the presence of silicon particles distributed along grain boundaries. Irradiation with an electron beam of the Ti film/silumin substrate system at different energy densities (10, 15, 30 J/cm$^2$) leads to a change in surface morphology, crystallite size, and phase composition, and an increase in energy density leads to the melting of the Ti film and the silumin layer.
Mots-clés : silumin, elemental and phase composition
Keywords: titanium, film/substrate system, pulsed electron beam, defect substructure.
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     author = {D. V. Zaguliaev and Yu. F. Ivanov and O. S. Tolkachev and V. V. Shlyarov and Yu. A. Shlyarova},
     title = {The evolution of a {Ti} film/silumin substrate system irradiated by a pulse electron beam},
     journal = {Vestnik \^U\v{z}no-Uralʹskogo gosudarstvennogo universiteta. Seri\^a, Matematika, mehanika, fizika},
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D. V. Zaguliaev; Yu. F. Ivanov; O. S. Tolkachev; V. V. Shlyarov; Yu. A. Shlyarova. The evolution of a Ti film/silumin substrate system irradiated by a pulse electron beam. Vestnik Ûžno-Uralʹskogo gosudarstvennogo universiteta. Seriâ, Matematika, mehanika, fizika, Tome 16 (2024) no. 3, pp. 50-61. http://geodesic.mathdoc.fr/item/VYURM_2024_16_3_a7/