Illumination system for sub-diffraction resolution microscopy

S. A. Asselborn   ; E. S. Zatsepin   ; D. S. Isakov   ; A. M. Gerasimov   ; D. G. Pikhulya   ; Yu. V. Miklyaev

Vestnik Ûžno-Uralʹskogo gosudarstvennogo universiteta. Seriâ, Matematika, mehanika, fizika, Tome 14 (2022) no. 3, pp. 68-78

Résumé

Illumination scheme for superresolution microscopy is developed. The scheme accomplishes dark filed illumination with a laser light source including spatial coherence suppression. The scheme allows to observe nanoparticles with a size smaller than 50 nm. This is necessary to get higher resolution in the previously proposed method of superresolution microscopy (Near field Optical Random Microscopy - NORM). This method is based on real-time video processing of a nanoparticles Brownian motion those are located near the object surface. The method of vertical coordinate measurement is demonstrated. This method is based on astigmatic nanoparticle imaging. Three-dimensional distributions of suspended nanoparticles are obtained. Vertical resolution better than 200 nm and lateral resolution better than 100 nm are demonstrated.

Détail

Keywords: microscopy, nanoscopy, near-field microscopy, super-resolution, particle trajectory analysis, video processing.
Mots-clés : nanoparticles

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