Information and program support of the analysis and processing of holographic information

A. G. Karpov ; V. V. Trofimov ; A. G. Fedorov

Vestnik Sankt-Peterburgskogo universiteta. Prikladnaâ matematika, informatika, processy upravleniâ, Tome 17 (2021) no. 4, pp. 409-418

Résumé

The research of thin films of various materials on nano- and microlevel is undoubtedly topical. Three-dimensional images of thin films can significantly increase the level of the received results. Intellectual computer support of researches assumes the existence or creation of mathematical and the software that implements the experimental program. Such support can most effectively be realized with the help of an information and expert system, based on a holographic electron microscope. In this work we presented an information and expert system for solving this problem. When creating instrumental, hardware and software tools for non-destructive research of the 3D structure of objects, we proceeded from the assumption that the most complete information about the object of research can be obtained only with a comprehensive approach to the analysis of the structure of the object using complementary techniques that allow obtaining data as a 3D image.

Détail

Keywords: electronic holography, image processing, information-expert system, diagnostics of nanostructures, tool module.
Mots-clés : information module

Bibliographie

[1] Kartashev V. A., Kartashev V. V., “Obtaining of nanoscale surface images by simulation of stm measuring process”, Nano- and microsystem technology, 18 (2016), 131–133 (In Russian)

[2] Ignatov I. I., Mosin O. V., “Research of the structural-functional properties of the fullerene-like shungite and micro-crystalline alumosilicate mineral zeolite by elemental analysis, TEM, IR and DNES”, Nano- and microsystem technology, 18 (2016), 357–366 (In Russian)

[3] Egorov O. V., Technical microscopy, Tekhnosfera Publ, M., 2007, 376 pp. (In Russian)

[4] Egorov N. V., Karpov A. G., Antonova L. I., Fedorov A. G., Trofimov V. V., “Technique for investigating the spatial structure of thin films at a nanolevel”, Journal of Surface Investigation: $X$-Ray, synchrotron and neutron techniques, 5:5 (2011), 992–995 | DOI

[5] Egorov N. V., Karpov A. G., Diagnostic information and expert systems, St. Petersburg University Press, St. Petersburg, 2002, 490 pp. (In Russian)

[6] Edgar V., Lawrence F. A., David C. J., Introduction to electron holography, Kluwer Academic/Plenum Publ, New York, 1999, 354 pp.

[7] Fink H.-W., Stocker W., Schmid H., “Holography with low-energy electrons”, Phys. Rev. Lett., 65:10 (1990), 1204–1206 | DOI

[8] Egorov N. V., Antonova L. I., Tatarinov P. S. et al., “Lens-free low-energy projection microscope for axial electronic holography (kendroscope)”, Instruments and experimental techniques, 2000, no. 5, 157–158 (In Russian)

[9] Gonzalez R., Woods R., Digital image processing: international version, $3^{\rm rd}$ ed., Prentice Hall, Upper Saddle River, New York, USA, 2008, 976 pp.

[10] Miano J., Compressed image file formats: JPEG, PNG, GIF, XBM, BMP ACM, Addison Wesley Longman Press, Boston, 1999, 264 pp.

[11] Morin R., Degiovanni A., “Interferometry with low-energy electrons”, JVST B — Microelectronics and nanometer structures, 13:2 (1995), 407–409 | DOI

[12] Nussbaumer H. J., Fast Fourier transform and convolution algorithms, Springer, Berlin–Heidelberg, 1981, 276 pp. | MR | Zbl

[13] Fedorov A. G., Karpov A. G., “Numerical restoration of holographic images for research of structure of thin films”, Vestnik of Saint Petersburg University. Series 10. Applied Mathematics. Computer Science. Control Processes, 2011, no. 2, 76–80 (In Russian)

[14] Smart Ju., Hock K., Csomor S., Cross-platform GUI programming with wxWidgets, Bruce Perens' Open Source Series, Prentice Hall, Upper Saddle River, New York, USA, 2006, 700 pp.

[15] Zharkov S. M., “Methods of modern transmission electron microscopy in material study”, Journal of Siberian Federal University. Chemistry, 4:2 (2009), 294–306