Lower estimate of the length of the complete test in the basis $\{x|y\}$
Vestnik Moskovskogo universiteta. Matematika, mehanika, no. 4 (2015), pp. 49-51 Cet article a éte moissonné depuis la source Math-Net.Ru

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It is proved that the length of the complete test is no less than $n+1$ ($n\ge 2$) for any circuit realizing the function $x_1\vee x_2\vee \ldots \vee x_n$ in the “ Sheffer stroke” basis with possible constant faults of type “1”. An example of such circuit is constructed so that the length of the complete test is exactly $n+1$.
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Yu. V. Borodina. Lower estimate of the length of the complete test in the basis $\{x|y\}$. Vestnik Moskovskogo universiteta. Matematika, mehanika, no. 4 (2015), pp. 49-51. http://geodesic.mathdoc.fr/item/VMUMM_2015_4_a7/

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