Numerical study of stability for weighted finite difference schemes
Numerical methods and programming, Tome 12 (2011) no. 1, pp. 97-102
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Stability of weighted finite difference schemes used to simulate the drift diffusion thermal transient processes in diode power semiconductor structures is studied with consideration of parasitic and load elements. It is shown that the finite difference scheme for the continuity equation might be unstable with an oscillating behavior of the solution in a wide range of the time step for the weight values between 0.5 and 0.7.
Keywords:
simulation; finite difference; numerical methods; semiconductor devices; continuity equation; diffusion; drift.
@article{VMP_2011_12_1_a11,
author = {S. A. Mesheryakov},
title = {Numerical study of stability for weighted finite difference schemes},
journal = {Numerical methods and programming},
pages = {97--102},
year = {2011},
volume = {12},
number = {1},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/VMP_2011_12_1_a11/}
}
S. A. Mesheryakov. Numerical study of stability for weighted finite difference schemes. Numerical methods and programming, Tome 12 (2011) no. 1, pp. 97-102. http://geodesic.mathdoc.fr/item/VMP_2011_12_1_a11/