On Reliability of Combinatorial Circuits in Bases Containing Functions with at Most Three Variables
Učënye zapiski Kazanskogo universiteta. Seriâ Fiziko-matematičeskie nauki, Kazanskii Gosudarstvennyi Universitet. Uchenye Zapiski. Seriya Fiziko-Matematichaskie Nauki, Tome 151 (2009) no. 2, pp. 25-35 Cet article a éte moissonné depuis la source Math-Net.Ru

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We consider the realization of Boolean functions by combinatorial circuits with gates realizing functions from a complete basis $B$, containing functions with at most three variables. We assume that gates can have inverse faults on the outputs independently with the probability $\varepsilon$ ($\varepsilon\in(0;1/2)$). We describe a set $G$ of Boolean functions depending essentially on three variables, and prove that for almost all Boolean functions the unreliability of asymptotically optimal circuits is asymptotically equal to $\varepsilon$ (when $\varepsilon$ tends to 0) if and only if $G\cap B\ne\emptyset$.
Keywords: unreliable functional gates, optimal combinatorial circuits, inverse faults, realization of Boolean functions by combinatorial circuits with unreliable functional gates, synthesis of reliable circuits.
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     title = {On {Reliability} of {Combinatorial} {Circuits} in {Bases} {Containing} {Functions} with at {Most} {Three} {Variables}},
     journal = {U\v{c}\"enye zapiski Kazanskogo universiteta. Seri\^a Fiziko-matemati\v{c}eskie nauki},
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M. A. Alekhina; A. V. Vasin. On Reliability of Combinatorial Circuits in Bases Containing Functions with at Most Three Variables. Učënye zapiski Kazanskogo universiteta. Seriâ Fiziko-matematičeskie nauki, Kazanskii Gosudarstvennyi Universitet. Uchenye Zapiski. Seriya Fiziko-Matematichaskie Nauki, Tome 151 (2009) no. 2, pp. 25-35. http://geodesic.mathdoc.fr/item/UZKU_2009_151_2_a3/

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