The Influence of Lateral Probe Oscillations on Shear-Force Images
Učënye zapiski Kazanskogo universiteta. Seriâ Fiziko-matematičeskie nauki, Kazanskii Gosudarstvennyi Universitet. Uchenye Zapiski. Seriya Fiziko-Matematichaskie Nauki, Tome 150 (2008) no. 2, pp. 160-165 Cet article a éte moissonné depuis la source Math-Net.Ru

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The paper regards the lateral (i.e. surface parallel) probe oscillations of shear-force microscope. This type of microscopes is widely applied in near-field optics. A method of probe curvature radii determination has been developed. The dependence of probe effective radii on lateral amplitude oscillation was obtained. This dependence has a local minimum that corresponds to optimal work regime. The experiments were carried out to determine probe oscillation shape. As a result, an idea about probe oscillation nodes was proposed.
Keywords: scanning probe microscopy, near-field, shear-force, apertureless tips.
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D. V. Lebedev; A. P. Chuklanov; A. A. Bukharaev; D. A. Bizyaev. The Influence of Lateral Probe Oscillations on Shear-Force Images. Učënye zapiski Kazanskogo universiteta. Seriâ Fiziko-matematičeskie nauki, Kazanskii Gosudarstvennyi Universitet. Uchenye Zapiski. Seriya Fiziko-Matematichaskie Nauki, Tome 150 (2008) no. 2, pp. 160-165. http://geodesic.mathdoc.fr/item/UZKU_2008_150_2_a21/

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