Raising the accuracy of monitoring the optical coating deposition by application of a nonlocal algorithm of data analysis
Sibirskij žurnal industrialʹnoj matematiki, Tome 23 (2020) no. 2, pp. 93-105.

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Under consideration is the inverse problem of controlling the deposition of a multilayer coating using optical monitoring. Some new nonlocal algorithm is introduced for data analysis. Using the simulation of deposition process, the errors are compared of the proposed nonlocal algorithm and the traditional local algorithm. A scheme of correction of the levels of the deposition process termination is considered which allows us to improve the accuracy of deposition monitoring. We show that the introduced nonlocal algorithm is more efficient both for the deposition without correction of the signal level for the deposition interruption and with correction of this level.
Keywords: inverse problem, analysis of experimental data, computational algorithm, thin film coating.
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     title = {Raising the accuracy of monitoring the optical coating deposition by application of a nonlocal algorithm of  data analysis},
     journal = {Sibirskij \v{z}urnal industrialʹnoj matematiki},
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I. V. Kochikov; Yu. S. Lagutin; A. A. Lagutina; D. V. Lukyanenko; A. V. Tikhonravov; A. G. Yagola. Raising the accuracy of monitoring the optical coating deposition by application of a nonlocal algorithm of  data analysis. Sibirskij žurnal industrialʹnoj matematiki, Tome 23 (2020) no. 2, pp. 93-105. http://geodesic.mathdoc.fr/item/SJIM_2020_23_2_a6/

[1] A. Macleod, “Monitoring of optical coatings”, Appl. Opt., 20 (1981), 82–89 | DOI

[2] A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, “Investigation of the error selfcompensation effect associated with broadband optical monitoring”, Appl. Opt., 50 (2011), C111–C116 | DOI

[3] V. Zhupanov, I. Kozlov, V. Fedoseev, P. Konotopov, M. Trubetskov, A. Tikhonravov, “Production of Brewster angle thin film polarizers using a ZrO$_2$/SiO$_2$ pair of materials”, Appl. Opt., 56 (2017), S30–C34 | DOI

[4] A. Zöller, M. Boos, R. Goetzelmann, H. Hagedorn, B. Romanov, M. Viet, “Accuracy and error compensation with direct monochromatic monitoring”, Optical Interference Coatings, OSA Technical Digest Series, 2013, WB5

[5] A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, “Investigation of the effect of accumulation of thickness errors in optical coating production using broadband optical monitoring”, Appl. Opt., 45 (2006), 7026–7034 | DOI

[6] A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, “Statistical approach to choosing a strategy of monochromatic monitoring of optical coating production”, Appl. Opt., 45 (2006), 7863–7870 | DOI

[7] F. Zhao, “Monitoring of periodic multilayers by the level method”, Appl. Opt., 24 (1985), 3339–3342 | DOI

[8] A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, “Optical monitoring strategies for optical coating manufacturing”, Optical thin films and coatings: from materials to applications, Woodhead Publishing Series in Eectronic and Optical Materials, Woodhead Pub, Philadelphia, 2018, 65–101

[9] M. Born, E. Wolf, Principles of optics: electromagnetic theory of propagation, interference and diffraction of light, Univ. Press, Cambridge, 2013 | MR

[10] T. F. Isaev, I. V. Kochikov, D. V. Lukyanenko, A. V. Tikhonravov, A. G. Yagola, “Regularizing algorithms for the determination of thickness of deposited layers in optical coating production”, Eurasian J. Math. Comput. Appl., 6:4 (2018), 38–47

[11] I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Luk'yanenko, A. V. Tikhonravov, A. G. Yagola, “A Nonlocal Algorithm for Data Analysis of Monochromatic Control of the Process of Multilayered Coating Production”, Vychisl. Metody i Programmirovanie, 20 (2019), 471–480 (in Russian)

[12] T. F. Isaev, D. V. Lukyanenko, A. V. Tikhonravov, A. G. Yagola, “Algorithms for solving inverse problems in the optics of layered media based on comparing the extrema of spectral characteristics”, Comput. Math. Math. Physics, 57:5 (2017), 867–875 | DOI | MR | Zbl