Estimation of quality of simple hardware random numbers generator
Problemy fiziki, matematiki i tehniki, no. 2 (2018), pp. 103-105
Cet article a éte moissonné depuis la source Math-Net.Ru
A simple implementation of a hardware random number generator that uses the avalanche breakdown effect of the bipolar transistor transition is offered. According to the results of statistical experiments, a conclusion is made about the possibility of using this device in various hardware-software systems.
Keywords:
hardware random numbers generator, noise generator, avalanche breakdown of a transistor, statistical criterion.
@article{PFMT_2018_2_a15,
author = {P. L. Chechat and V. D. Liauchuk and A. V. Varuyeu and E. A. Liachuk},
title = {Estimation of quality of simple hardware random numbers generator},
journal = {Problemy fiziki, matematiki i tehniki},
pages = {103--105},
year = {2018},
number = {2},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/PFMT_2018_2_a15/}
}
TY - JOUR AU - P. L. Chechat AU - V. D. Liauchuk AU - A. V. Varuyeu AU - E. A. Liachuk TI - Estimation of quality of simple hardware random numbers generator JO - Problemy fiziki, matematiki i tehniki PY - 2018 SP - 103 EP - 105 IS - 2 UR - http://geodesic.mathdoc.fr/item/PFMT_2018_2_a15/ LA - ru ID - PFMT_2018_2_a15 ER -
P. L. Chechat; V. D. Liauchuk; A. V. Varuyeu; E. A. Liachuk. Estimation of quality of simple hardware random numbers generator. Problemy fiziki, matematiki i tehniki, no. 2 (2018), pp. 103-105. http://geodesic.mathdoc.fr/item/PFMT_2018_2_a15/
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