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@article{PFMT_2013_4_a3, author = {Seidi Hassan and V. F. Gremenok and V. A. Ivanov}, title = {Preparation and investgation of microstructural properties of $\mathrm{Pb_xSn_{1-x}Te}$ bulk alloys}, journal = {Problemy fiziki, matematiki i tehniki}, pages = {28--31}, publisher = {mathdoc}, number = {4}, year = {2013}, language = {en}, url = {http://geodesic.mathdoc.fr/item/PFMT_2013_4_a3/} }
TY - JOUR AU - Seidi Hassan AU - V. F. Gremenok AU - V. A. Ivanov TI - Preparation and investgation of microstructural properties of $\mathrm{Pb_xSn_{1-x}Te}$ bulk alloys JO - Problemy fiziki, matematiki i tehniki PY - 2013 SP - 28 EP - 31 IS - 4 PB - mathdoc UR - http://geodesic.mathdoc.fr/item/PFMT_2013_4_a3/ LA - en ID - PFMT_2013_4_a3 ER -
%0 Journal Article %A Seidi Hassan %A V. F. Gremenok %A V. A. Ivanov %T Preparation and investgation of microstructural properties of $\mathrm{Pb_xSn_{1-x}Te}$ bulk alloys %J Problemy fiziki, matematiki i tehniki %D 2013 %P 28-31 %N 4 %I mathdoc %U http://geodesic.mathdoc.fr/item/PFMT_2013_4_a3/ %G en %F PFMT_2013_4_a3
Seidi Hassan; V. F. Gremenok; V. A. Ivanov. Preparation and investgation of microstructural properties of $\mathrm{Pb_xSn_{1-x}Te}$ bulk alloys. Problemy fiziki, matematiki i tehniki, no. 4 (2013), pp. 28-31. http://geodesic.mathdoc.fr/item/PFMT_2013_4_a3/
[1] S. O. Ferreira et al., “Experimental observation of band inversion in the $\mathrm{PbSnTe}$ system”, J. Appl. Phys., 86:12 (1999), 7198–7200 | DOI
[2] B. Steiner et al., “High resolution X-ray diffraction imaging of lead tin telluride”, J. Crystal Growth, 114:4 (1991), 707–714 | DOI
[3] R. W. Bicknell, “The interpretation of X-Ray diffraction data from thin epitaxial Lead-Tin Telluride crystals”, Infrared Physics, 17:1 (1977), 57–62 | DOI
[4] H. Kimura, “Single crystal growth of lead-tin telluride”, J. of Electronic Materials, 1:1 (1972), 165–180 | DOI
[5] A. Y. Ueta et al., “IV–VI Compound heterostructures grown by molecular beam epitaxy”, Microelectronics Journal, 33:4 (2002), 331–335 | DOI
[6] J. König et al., “Thermoelectric properties of undoped PbSe and PbTe tin alloyed epitaxial MBE films on BaF2 substrates”, European Conference on Thermoelectrics, ECT'2005 Proceedings (1–2 September 2005, Nancy, France), 39–42
[7] Nugraha et al., “Growth and crystal properties of $\mathrm{Tl}$-doped $\mathrm{PbTe}$ crystals grown by Bridgman method under $\mathrm{Pb}$ and $\mathrm{Te}$ vapor pressure”, Journal of Crystal Growth, 222:1–2 (2001), 38–43 | DOI
[8] L. C. Feldman, J. W. Mayer, Fundamentals of Surface and Thin Film Analysis, North-Holland, New York–Amsterdam–London, 1986, 344 pp.
[9] J. B. Nelson, D. P. Riley, “An experimental investigation of extrapolation methods in the derivation of accurate unit-cell dimensions of crystals”, Proc. Phys. Soc. (London), 57:3 (1945), 160–177 | DOI
[10] C. Suryanarayana, M. G. Norton, X-ray Diffraction Practical Approach, Plenum Press, New York, 1998, 153–166 | DOI
[11] B. D. Cullity, S. R. Stock, Elements of X-ray Diffraction, Ch. 13, 3rd Edition, Prentice-Hall, Upper Saddle River, NJ, 2001, 363–383
[12] M. F. De Campos et al., “Uncertainty estimation of lattice parameters measured by X-Ray diffraction”, XVIII IMEKO World Congress: Metrology for a Sustainable Development (17–22 September 2006, Rio de Janeiro, Brazil)
[13] M. Abdel Rafea et al., “Effect of substrate temperature on the galvanomagnetic, photoelectrical and optical properties of $\mathrm{Pb_{0.8}Sn_{0.2}Te}$ thin films”, Chalcogenide Letters, 6:3 (2009), 115–123
[14] N. R. Short, “A redetermination of the lattice parameters of $\mathrm{Pb_xSn_{1-x}Te}$ alloys”, Brit. J. Appl. Phys., 1:2 (1968), 129–130
[15] R. F. Bis, J. R. Dixon, “Applicability of Vegard's Law to the $\mathrm{Pb_xSn_{1-x}Te}$ Alloy System”, J. Appl. Phys., 40:4 (1969), 1918–1921 | DOI