Geodesic
Light reflection by the subsurface layer with unhomogenious broadening of absorption resonance
Problemy fiziki, matematiki i tehniki, no. 1 (2012), pp. 31-35

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The possibility of hysteresis behaviour of nonlinear and spectral dependences of thin boundary film resonant reflection is theoretically defined under conditions of light field spectrum linewidth broadening and unhomogenious broadening of absorption resonance. The problem is considered for parameters of planar thin layers on the basis of quantum-well semiconductor structures.
Keywords: light field spectrum linewidth broadening, optical hysteresis, submicronic semiconductor films. 
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     author = {T. V. Timoschenko and V. A. Yurevich and Yu. V. Yurevich},
     title = {Light reflection by the subsurface layer with unhomogenious broadening of absorption resonance},
     journal = {Problemy fiziki, matematiki i tehniki},
     pages = {31--35},
     publisher = {mathdoc},
     number = {1},
     year = {2012},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/PFMT_2012_1_a5/}
}
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T. V. Timoschenko; V. A. Yurevich; Yu. V. Yurevich. Light reflection by the subsurface layer with unhomogenious broadening of absorption resonance. Problemy fiziki, matematiki i tehniki, no. 1 (2012), pp. 31-35. http://geodesic.mathdoc.fr/item/PFMT_2012_1_a5/