Logical-combinatorial multicriteria selection of diagnostic tests optimal subset
Prikladnaâ diskretnaâ matematika, no. 10 (2009), pp. 113-114.

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Optimization problem of multicriteria selection from the set of irredundant unconditional diagnostic tests (IUDT) of optimal subset satisfying the prescribed 5 criteria is considered. A logical-combinatorial algorithm of selection of optimal subset of IUDT is suggested. The algorithm is realized in form of dynamic link library to software IMSLOG. Applied intelligent systems are constructed on the base of it. The ways of further development of the algorithm are presented.
@article{PDM_2009_10_a58,
     author = {A. E. Yankovskaya and A. E. Petelin},
     title = {Logical-combinatorial multicriteria selection of diagnostic tests optimal subset},
     journal = {Prikladna\^a diskretna\^a matematika},
     pages = {113--114},
     publisher = {mathdoc},
     number = {10},
     year = {2009},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/PDM_2009_10_a58/}
}
TY  - JOUR
AU  - A. E. Yankovskaya
AU  - A. E. Petelin
TI  - Logical-combinatorial multicriteria selection of diagnostic tests optimal subset
JO  - Prikladnaâ diskretnaâ matematika
PY  - 2009
SP  - 113
EP  - 114
IS  - 10
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/PDM_2009_10_a58/
LA  - ru
ID  - PDM_2009_10_a58
ER  - 
%0 Journal Article
%A A. E. Yankovskaya
%A A. E. Petelin
%T Logical-combinatorial multicriteria selection of diagnostic tests optimal subset
%J Prikladnaâ diskretnaâ matematika
%D 2009
%P 113-114
%N 10
%I mathdoc
%U http://geodesic.mathdoc.fr/item/PDM_2009_10_a58/
%G ru
%F PDM_2009_10_a58
A. E. Yankovskaya; A. E. Petelin. Logical-combinatorial multicriteria selection of diagnostic tests optimal subset. Prikladnaâ diskretnaâ matematika, no. 10 (2009), pp. 113-114. http://geodesic.mathdoc.fr/item/PDM_2009_10_a58/

[1] Yankovskaya A. E., Mozheiko V. I., “Optimization of a set of tests selection satisfying the criteria prescribed”, 7th Int. Conf. PRIA-7-2004. Conf. Proc., V. I, SPbETU, St. Petersburg, 2004, 145–148

[2] Yankovskaya A. E., Gedike A. I., Ametov R. V., Bleikher A. M., “Software Tool for Supporting Information Technologies of Test Pattern Recognition”, Pattern Recognition and Image Analysis, 13:2 (2003), 243–246