About unreliability bounds for circuit with inverse faults and functional element breakdowns
Prikladnaya Diskretnaya Matematika. Supplement, no. 6 (2013), pp. 50-51 Cet article a éte moissonné depuis la source Math-Net.Ru

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The realization of Boolean functions by circuits of unreliable functional elements is considered in an arbitrary complete basis. It’s supposed that all circuit elements are independently of each other proned to faults of two types: output inverse faults and element breakdowns. Upper and lower asymptotical bounds of circuit unreliability are presented.
Keywords: Boolean functions, functional element, unreliability of circuit, output inverse faults, element breakdowns.
Mots-clés : circuit
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     author = {M. A. Alekhina and O. U Barsukova},
     title = {About unreliability bounds for circuit with inverse faults and functional element breakdowns},
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M. A. Alekhina; O. U Barsukova. About unreliability bounds for circuit with inverse faults and functional element breakdowns. Prikladnaya Diskretnaya Matematika. Supplement, no. 6 (2013), pp. 50-51. http://geodesic.mathdoc.fr/item/PDMA_2013_6_a24/

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