Geodesic
Structural, optical and morphological study of tungsten selenide thin films
Nanosistemy: fizika, himiâ, matematika, Tome 7 (2016) no. 4, pp. 703-706.

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Tungsten selenide (WSe$_2$) film was successfully deposited on FTO substrate by brush plating technique. The film was uniform and well adherent to the substrate and annealed to 300$^\circ$ C and 500$^\circ$ C. As the annealing temperature was increased the orientation of the crystallites was more randomized than in the as-prepared film. The structural and optical properties of the film were investigated by XRD, SEM, EDAX, UV-Visible and PL. The XRD pattern indicates that this film was crystallized in the hexagonal structure.
Keywords: WSe thin film, morphology. 
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     author = {S. Arulmozhi Packiaseeli and V. Rajendran and R. Vijayalakshmi},
     title = {Structural, optical and morphological study of tungsten selenide thin films},
     journal = {Nanosistemy: fizika, himi\^a, matematika},
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     publisher = {mathdoc},
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     number = {4},
     year = {2016},
     language = {en},
     url = {http://geodesic.mathdoc.fr/item/NANO_2016_7_4_a26/}
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S. Arulmozhi Packiaseeli; V. Rajendran; R. Vijayalakshmi. Structural, optical and morphological study of tungsten selenide thin films. Nanosistemy: fizika, himiâ, matematika, Tome 7 (2016) no. 4, pp. 703-706. http://geodesic.mathdoc.fr/item/NANO_2016_7_4_a26/