Geodesic
Utilizing of the Medium-Energy Ion Scattering spectrometry for the composition investigation of graphene oxide films on silicon surface
Nanosistemy: fizika, himiâ, matematika, Tome 5 (2014) no. 1, pp. 113-116 Cet article a éte moissonné depuis la source Math-Net.Ru

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The possibilities of Medium-Energy Ion Scattering (MEIS) spectrometry combined with ion channeling for the estimation of the composition of single layer graphene oxide films and produced graphene layers deposited on the surface of standard silicon substrates was investigated. It was found that the oxygen amount in the natural surface silicon oxide ranges from 2–8 times the possible oxygen content in a graphene oxide layer. This causes difficulties in the estimation of the oxygen concentration in graphene oxide deposited on such substrates. The proposed method of preliminary single hydrogen cathode surface processing in electroplating bath leads to the significant decrease of surface layer oxygen content which results in an increase in the accuracy of reduced graphene oxide composition estimation.
Keywords: graphene oxide, silicon oxide, Rutherford Back Scattering spectrometry. 
@article{NANO_2014_5_1_a14,
     author = {V. V. Afrosimov and A. T. Dideykin and V. I. Sakharov and I. T. Serenkov and S. P. Vul'},
     title = {Utilizing of the {Medium-Energy} {Ion} {Scattering} spectrometry for the composition investigation of graphene oxide films on silicon surface},
     journal = {Nanosistemy: fizika, himi\^a, matematika},
     pages = {113--116},
     year = {2014},
     volume = {5},
     number = {1},
     language = {en},
     url = {http://geodesic.mathdoc.fr/item/NANO_2014_5_1_a14/}
}
TY  - JOUR
AU  - V. V. Afrosimov
AU  - A. T. Dideykin
AU  - V. I. Sakharov
AU  - I. T. Serenkov
AU  - S. P. Vul'
TI  - Utilizing of the Medium-Energy Ion Scattering spectrometry for the composition investigation of graphene oxide films on silicon surface
JO  - Nanosistemy: fizika, himiâ, matematika
PY  - 2014
SP  - 113
EP  - 116
VL  - 5
IS  - 1
UR  - http://geodesic.mathdoc.fr/item/NANO_2014_5_1_a14/
LA  - en
ID  - NANO_2014_5_1_a14
ER  - 
%0 Journal Article
%A V. V. Afrosimov
%A A. T. Dideykin
%A V. I. Sakharov
%A I. T. Serenkov
%A S. P. Vul'
%T Utilizing of the Medium-Energy Ion Scattering spectrometry for the composition investigation of graphene oxide films on silicon surface
%J Nanosistemy: fizika, himiâ, matematika
%D 2014
%P 113-116
%V 5
%N 1
%U http://geodesic.mathdoc.fr/item/NANO_2014_5_1_a14/
%G en
%F NANO_2014_5_1_a14
V. V. Afrosimov; A. T. Dideykin; V. I. Sakharov; I. T. Serenkov; S. P. Vul'. Utilizing of the Medium-Energy Ion Scattering spectrometry for the composition investigation of graphene oxide films on silicon surface. Nanosistemy: fizika, himiâ, matematika, Tome 5 (2014) no. 1, pp. 113-116. http://geodesic.mathdoc.fr/item/NANO_2014_5_1_a14/