Geodesic
Topograms production with use of pulsed teraherz reflectometer
Nanosistemy: fizika, himiâ, matematika, Tome 3 (2012) no. 5, pp. 33-41.

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It has been considered the possibilities of the experimental setup for temporary registration form of pulsed THz radiation reflected from objects (THz reflectometer) for pulsed terahertz imaging reflectometry and tomography, the visualization of internal objects structures which are transparent in the THz frequency range. It has been received two- and three-dimensional topograms test object and defined resolution limit of the method. It has been found that the space-time registration form of the reflected pulses can effectively generate topograms of surfaces with relief depth ranging from 1 to 1000 microns.
Keywords: pulsed teraherz radiation, tomography, reflectometry, flaw detection. 
@article{NANO_2012_3_5_a1,
     author = {M. S. Kulya and Ya. V. Grachev and V. G. Bespalov},
     title = {Topograms production with use of pulsed teraherz reflectometer},
     journal = {Nanosistemy: fizika, himi\^a, matematika},
     pages = {33--41},
     publisher = {mathdoc},
     volume = {3},
     number = {5},
     year = {2012},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/NANO_2012_3_5_a1/}
}
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M. S. Kulya; Ya. V. Grachev; V. G. Bespalov. Topograms production with use of pulsed teraherz reflectometer. Nanosistemy: fizika, himiâ, matematika, Tome 3 (2012) no. 5, pp. 33-41. http://geodesic.mathdoc.fr/item/NANO_2012_3_5_a1/