The new mathematical model for the analysis of subtle substrate imperfections
Matematičeskoe modelirovanie, Tome 22 (2010) no. 5, pp. 122-130.

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A novel mathematical model for the analysis subtle substrate imperfections such as flat pit and bump in a substrate has been proposed. An investigation has been carried out and the result of the application of the model has been obtained in the case of three-dimensional scattering problem for different types of substrate imperfections.
Keywords: substrate imperfections, scattering problem.
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A. V. Baryshev; Yu. A. Eremin. The new mathematical model for the analysis of subtle substrate imperfections. Matematičeskoe modelirovanie, Tome 22 (2010) no. 5, pp. 122-130. http://geodesic.mathdoc.fr/item/MM_2010_22_5_a11/

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[5] Eremin Yu. A., “Obobschenie opticheskoi teoremy na osnove integro-funktsionalnykh sootnoshenii”, Differentsialnye uravneniya, 43:9 (2007), 1168–1172 | MR | Zbl