Geodesic
Optimal Tests and Estimators for Truncated Exponential Families.
Metrika, Tome 29 (1982), pp. 103-114 Cet article a éte moissonné depuis la source European Digital Mathematics Library

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Mots-clés : truncated exponential families, Blackwell-Rao-Lehmann-Scheffe theory, minimum variance unbiased estimators, uniformly most powerful unbiased tests 
@article{MET_1982__29_175844,
     author = {M.A. Beg},
     title = {Optimal {Tests} and {Estimators} for {Truncated} {Exponential} {Families.}},
     journal = {Metrika},
     pages = {103--114},
     year = {1982},
     volume = {29},
     zbl = {0492.62024},
     url = {http://geodesic.mathdoc.fr/item/MET_1982__29_175844/}
}
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JO  - Metrika
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VL  - 29
UR  - http://geodesic.mathdoc.fr/item/MET_1982__29_175844/
ID  - MET_1982__29_175844
ER  - 
%0 Journal Article
%A M.A. Beg
%T Optimal Tests and Estimators for Truncated Exponential Families.
%J Metrika
%D 1982
%P 103-114
%V 29
%U http://geodesic.mathdoc.fr/item/MET_1982__29_175844/
%F MET_1982__29_175844
M.A. Beg. Optimal Tests and Estimators for Truncated Exponential Families.. Metrika, Tome 29 (1982), pp. 103-114. http://geodesic.mathdoc.fr/item/MET_1982__29_175844/