Optimal Tests and Estimators for Truncated Exponential Families.
Metrika, Tome 29 (1982), pp. 103-114.

Voir la notice de l'article provenant de la source European Digital Mathematics Library

Mots-clés : truncated exponential families, Blackwell-Rao-Lehmann-Scheffe theory, minimum variance unbiased estimators, uniformly most powerful unbiased tests
@article{MET_1982__29_175844,
     author = {M.A. Beg},
     title = {Optimal {Tests} and {Estimators} for {Truncated} {Exponential} {Families.}},
     journal = {Metrika},
     pages = {103--114},
     publisher = {mathdoc},
     volume = {29},
     year = {1982},
     zbl = {0492.62024},
     url = {http://geodesic.mathdoc.fr/item/MET_1982__29_175844/}
}
TY  - JOUR
AU  - M.A. Beg
TI  - Optimal Tests and Estimators for Truncated Exponential Families.
JO  - Metrika
PY  - 1982
SP  - 103
EP  - 114
VL  - 29
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/MET_1982__29_175844/
ID  - MET_1982__29_175844
ER  - 
%0 Journal Article
%A M.A. Beg
%T Optimal Tests and Estimators for Truncated Exponential Families.
%J Metrika
%D 1982
%P 103-114
%V 29
%I mathdoc
%U http://geodesic.mathdoc.fr/item/MET_1982__29_175844/
%F MET_1982__29_175844
M.A. Beg. Optimal Tests and Estimators for Truncated Exponential Families.. Metrika, Tome 29 (1982), pp. 103-114. http://geodesic.mathdoc.fr/item/MET_1982__29_175844/