Application of Focal Curves for X-ray Microdiffraction Methods
Journal for geometry and graphics, Tome 17 (2013) no. 2, pp. 205-211.

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In order to harness the full potential of X-ray diffraction methods, in particular the Kossel and X-ray Rotation Tilt technique, it is necessary to implement a fast and automatic detection and evaluation process for digital recordings or digitized film. Due to the registration of the reflection fine structure, the individual data can be used, e.g., for calculating the precision residual stress tensors directly. For this application it is necessary to know the complete recording geometry. In our method we pay attention to the focal curves: As all the diffraction cones have the same apex, the orientation can be determined solely by the reflection lines, which result as intersection with the image plane. The apex of the cones is the source of X-ray radiation in the investigated sample area. In addition to the principal point, the distance from the image plane to the sample can be determined by the respective focal curves of reflection lines without use of a scaling factor.
Classification : 51N05, 51N20, 68U10
Mots-clés : Conic section, focal conics, orientation, X-ray microdiffraction, Kossel technique
@article{JGG_2013_17_2_JGG_2013_17_2_a6,
     author = {F. Henschel and J. Bauch },
     title = {Application of {Focal} {Curves} for {X-ray} {Microdiffraction} {Methods}},
     journal = {Journal for geometry and graphics},
     pages = {205--211},
     publisher = {mathdoc},
     volume = {17},
     number = {2},
     year = {2013},
     url = {http://geodesic.mathdoc.fr/item/JGG_2013_17_2_JGG_2013_17_2_a6/}
}
TY  - JOUR
AU  - F. Henschel
AU  - J. Bauch 
TI  - Application of Focal Curves for X-ray Microdiffraction Methods
JO  - Journal for geometry and graphics
PY  - 2013
SP  - 205
EP  - 211
VL  - 17
IS  - 2
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/JGG_2013_17_2_JGG_2013_17_2_a6/
ID  - JGG_2013_17_2_JGG_2013_17_2_a6
ER  - 
%0 Journal Article
%A F. Henschel
%A J. Bauch 
%T Application of Focal Curves for X-ray Microdiffraction Methods
%J Journal for geometry and graphics
%D 2013
%P 205-211
%V 17
%N 2
%I mathdoc
%U http://geodesic.mathdoc.fr/item/JGG_2013_17_2_JGG_2013_17_2_a6/
%F JGG_2013_17_2_JGG_2013_17_2_a6
F. Henschel; J. Bauch . Application of Focal Curves for X-ray Microdiffraction Methods. Journal for geometry and graphics, Tome 17 (2013) no. 2, pp. 205-211. http://geodesic.mathdoc.fr/item/JGG_2013_17_2_JGG_2013_17_2_a6/