Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film
News of the Kabardin-Balkar scientific center of RAS, no. 6-1 (2017), pp. 29-35.

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An expression for the attractional Van der Waals force, obtained within an additivity approximation, on a neutral nanoprobe near a flat surface with dielectric thin film is obtained. Аfter analyzing numerical calculation data, we can conclude that the dielectric film presence appreciably changes attractional forces on nanoprobe and results in increasing relativity influence of macroscopic part of probe for small distance between probe and surface.
Keywords: attractional Van der Waals force, nanoprobe, dielectric surface, thin films.
@article{IZKAB_2017_6-1_a4,
     author = {A. A. Kanametov},
     title = {Attractional {Van} der {Waals} force on a neutral {AFM} probe near a flat surface with dielectric film},
     journal = {News of the Kabardin-Balkar scientific center of RAS},
     pages = {29--35},
     publisher = {mathdoc},
     number = {6-1},
     year = {2017},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/}
}
TY  - JOUR
AU  - A. A. Kanametov
TI  - Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film
JO  - News of the Kabardin-Balkar scientific center of RAS
PY  - 2017
SP  - 29
EP  - 35
IS  - 6-1
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/
LA  - ru
ID  - IZKAB_2017_6-1_a4
ER  - 
%0 Journal Article
%A A. A. Kanametov
%T Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film
%J News of the Kabardin-Balkar scientific center of RAS
%D 2017
%P 29-35
%N 6-1
%I mathdoc
%U http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/
%G ru
%F IZKAB_2017_6-1_a4
A. A. Kanametov. Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film. News of the Kabardin-Balkar scientific center of RAS, no. 6-1 (2017), pp. 29-35. http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/

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