Voir la notice de l'article provenant de la source Math-Net.Ru
@article{IZKAB_2017_6-1_a4, author = {A. A. Kanametov}, title = {Attractional {Van} der {Waals} force on a neutral {AFM} probe near a flat surface with dielectric film}, journal = {News of the Kabardin-Balkar scientific center of RAS}, pages = {29--35}, publisher = {mathdoc}, number = {6-1}, year = {2017}, language = {ru}, url = {http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/} }
TY - JOUR AU - A. A. Kanametov TI - Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film JO - News of the Kabardin-Balkar scientific center of RAS PY - 2017 SP - 29 EP - 35 IS - 6-1 PB - mathdoc UR - http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/ LA - ru ID - IZKAB_2017_6-1_a4 ER -
%0 Journal Article %A A. A. Kanametov %T Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film %J News of the Kabardin-Balkar scientific center of RAS %D 2017 %P 29-35 %N 6-1 %I mathdoc %U http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/ %G ru %F IZKAB_2017_6-1_a4
A. A. Kanametov. Attractional Van der Waals force on a neutral AFM probe near a flat surface with dielectric film. News of the Kabardin-Balkar scientific center of RAS, no. 6-1 (2017), pp. 29-35. http://geodesic.mathdoc.fr/item/IZKAB_2017_6-1_a4/
[1] H. Butt, B. Cappella, M. Kappl, “Force measurements with the atomic force microscope: Technique, interpretation and applications”, Surf. Science Rep, 59 (2005), 1–152 | DOI
[2] Yu. S. Barash, Sily Van-der-Vaalsa, Nauka, M., 1988, 344 pp. | MR
[3] D. N. Izraelashvili, Mezhmolekulyarnye i poverkhnostnye sily, Nauchnyi mir, M., 2011, 431 pp.
[4] M. Guggisberg, M. Bammerlin, Ch. Loppacher, et. al., “Separation of interactions by noncontact force microscopy”, Phys. Rev, B61:16 (2000), 11151–11155 | DOI
[5] M. Saint Jean, S. Hudlet, C. Guthmann, J. Berger, “Van der Waals and capacitive forces in atomic force microscopy”, J. Appl. Phys, 86:9 (1999), 5245–5248 | DOI
[6] C. Argento, R. H. French, “Parametric tip model and force-distance relation for Hamaker constant determination from atomic force microscopy”, Appl. Phys. Dec, 80 (1996), 6081–6090 | DOI
[7] A. A. Kanametov, Elektrostaticheskoe i van-der-vaalsovo vzaimodeistvie zondov atomno-silovogo mikroskopa s poverkhnostyami. Nalchik, diss. ... kand. fiz. mat. nauk, 2010, 109 pp.
[8] E. G. Dedkova, Kontaktnaya atomno-silovaya spektroskopiya metallicheskikh plenok i dielektricheskikh materialov. Nalchik, diss. ... kand. fiz. mat. nauk, 2008, 166 pp.
[9] G. V. Dedkov, A. A. Kyasov, “Fluktuatsionno-elektromagnitnoe vzaimodeistvie dvizhuschikhsya tel”, Nanostruktury. Matematicheskaya fizika i modelirovanie, 1:2 (2009), 5–58
[10] B. V. Deryagin, N. V. Churaev, V. M. Muller, Poverkhnostnye sily, Nauka, M., 1985, 400 pp.
[11] G. V. Dedkov, A. A. Kyasov, “Radiatsionnyi teploobmen sfericheskoi chastitsy s plastinoi”, Pisma v ZhTF, 36:18 (2010), 32–39