Geodesic
A compact testing method for digital devices that provides maximum control reliability
News of the Kabardin-Balkar scientific center of RAS, no. 1 (2005), pp. 64-69

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An algorithm has been proposed for compressing the output binary sequences of the digital device under test, which eliminates the risk of missing errors. The characteristics of the output binary sequences of a reference digital device necessary for this are determined and techniques are proposed to ensure their achievement.
Keywords: compact testing method, digital devices 
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     author = {Yu. K. Tlostanov},
     title = {A compact testing method for digital devices that provides maximum control reliability},
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     number = {1},
     year = {2005},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/IZKAB_2005_1_a1/}
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Yu. K. Tlostanov. A compact testing method for digital devices that provides maximum control reliability. News of the Kabardin-Balkar scientific center of RAS, no. 1 (2005), pp. 64-69. http://geodesic.mathdoc.fr/item/IZKAB_2005_1_a1/