Geodesic
Upper estimate of unreliability of schemes in full finite basis (in $P_2$) for arbitrary faults of gates
Izvestiâ vysših učebnyh zavedenij. Matematika, no. 12 (2017), pp. 80-83

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We consider the realization of Boolean functions by circuits from unreliable functional gates in full finite basis. We assume that each gate of the circuit is exposed to arbitrarily faults, and the gates faults are statistically independent. We construct the circuits for all Boolean functions and get their upper bound of the unreliability which depends on the worst (the most unreliable) of the basic gate.
Keywords: unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates. 
@article{IVM_2017_12_a7,
     author = {M. A. Alekhina and Yu. S. Gusynina and T. A. Shornikova},
     title = {Upper estimate of unreliability of schemes in full finite basis (in $P_2$) for arbitrary faults of gates},
     journal = {Izvesti\^a vys\v{s}ih u\v{c}ebnyh zavedenij. Matematika},
     pages = {80--83},
     publisher = {mathdoc},
     number = {12},
     year = {2017},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/IVM_2017_12_a7/}
}
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M. A. Alekhina; Yu. S. Gusynina; T. A. Shornikova. Upper estimate of unreliability of schemes in full finite basis (in $P_2$) for arbitrary faults of gates. Izvestiâ vysših učebnyh zavedenij. Matematika, no. 12 (2017), pp. 80-83. http://geodesic.mathdoc.fr/item/IVM_2017_12_a7/