Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
Diskretnaya Matematika, Tome 33 (2021) no. 1, pp. 20-30
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We prove that an arbitrary Boolean function may be implemented by an irredundant Boolean circuit over an arbitrary finite complete basis so that the circuit admits a single diagnostic test of length at most 4 with respect to inversion faults at gate outputs.
Keywords: Boolean circuit, single diagnostic test, inversion fault at gate output, Shannon function, easily testable circuit.
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I. G. Lyubich; D. S. Romanov. Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases. Diskretnaya Matematika, Tome 33 (2021) no. 1, pp. 20-30. http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/

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