Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
Diskretnaya Matematika, Tome 33 (2021) no. 1, pp. 20-30.

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We prove that an arbitrary Boolean function may be implemented by an irredundant Boolean circuit over an arbitrary finite complete basis so that the circuit admits a single diagnostic test of length at most 4 with respect to inversion faults at gate outputs.
Keywords: Boolean circuit, single diagnostic test, inversion fault at gate output, Shannon function, easily testable circuit.
@article{DM_2021_33_1_a2,
     author = {I. G. Lyubich and D. S. Romanov},
     title = {Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases},
     journal = {Diskretnaya Matematika},
     pages = {20--30},
     publisher = {mathdoc},
     volume = {33},
     number = {1},
     year = {2021},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/}
}
TY  - JOUR
AU  - I. G. Lyubich
AU  - D. S. Romanov
TI  - Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
JO  - Diskretnaya Matematika
PY  - 2021
SP  - 20
EP  - 30
VL  - 33
IS  - 1
PB  - mathdoc
UR  - http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/
LA  - ru
ID  - DM_2021_33_1_a2
ER  - 
%0 Journal Article
%A I. G. Lyubich
%A D. S. Romanov
%T Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
%J Diskretnaya Matematika
%D 2021
%P 20-30
%V 33
%N 1
%I mathdoc
%U http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/
%G ru
%F DM_2021_33_1_a2
I. G. Lyubich; D. S. Romanov. Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases. Diskretnaya Matematika, Tome 33 (2021) no. 1, pp. 20-30. http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/

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