Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
Diskretnaya Matematika, Tome 33 (2021) no. 1, pp. 20-30
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We prove that an arbitrary Boolean function may be implemented by an irredundant Boolean circuit over an arbitrary finite complete basis so that the circuit admits a single diagnostic test of length at most 4 with respect to inversion faults at gate outputs.
Keywords:
Boolean circuit, single diagnostic test, inversion fault at gate output, Shannon function, easily testable circuit.
@article{DM_2021_33_1_a2,
author = {I. G. Lyubich and D. S. Romanov},
title = {Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases},
journal = {Diskretnaya Matematika},
pages = {20--30},
publisher = {mathdoc},
volume = {33},
number = {1},
year = {2021},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/}
}
TY - JOUR AU - I. G. Lyubich AU - D. S. Romanov TI - Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases JO - Diskretnaya Matematika PY - 2021 SP - 20 EP - 30 VL - 33 IS - 1 PB - mathdoc UR - http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/ LA - ru ID - DM_2021_33_1_a2 ER -
I. G. Lyubich; D. S. Romanov. Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases. Diskretnaya Matematika, Tome 33 (2021) no. 1, pp. 20-30. http://geodesic.mathdoc.fr/item/DM_2021_33_1_a2/