Geodesic
Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs
Diskretnaya Matematika, Tome 31 (2019) no. 2, pp. 14-19

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We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length $1$ in case of constant faults of type “1” at gate outputs.
Keywords: Boolean circuits, constant faults, fault detection tests, Zhegalkin basis. 
@article{DM_2019_31_2_a1,
     author = {Yu. V. Borodina},
     title = {Easily testable circuits in {Zhegalkin} basis in the case of constant faults of type ``1'' at gate outputs},
     journal = {Diskretnaya Matematika},
     pages = {14--19},
     publisher = {mathdoc},
     volume = {31},
     number = {2},
     year = {2019},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DM_2019_31_2_a1/}
}
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Yu. V. Borodina. Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs. Diskretnaya Matematika, Tome 31 (2019) no. 2, pp. 14-19. http://geodesic.mathdoc.fr/item/DM_2019_31_2_a1/