Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
Diskretnaya Matematika, Tome 31 (2019) no. 2, pp. 14-19
We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length $1$ in case of constant faults of type “1” at gate outputs.
Keywords:
Boolean circuits, constant faults, fault detection tests, Zhegalkin basis.
@article{DM_2019_31_2_a1,
author = {Yu. V. Borodina},
title = {Easily testable circuits in {Zhegalkin} basis in the case of constant faults of type {\textquotedblleft}1{\textquotedblright} at gate outputs},
journal = {Diskretnaya Matematika},
pages = {14--19},
year = {2019},
volume = {31},
number = {2},
language = {ru},
url = {http://geodesic.mathdoc.fr/item/DM_2019_31_2_a1/}
}
Yu. V. Borodina. Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs. Diskretnaya Matematika, Tome 31 (2019) no. 2, pp. 14-19. http://geodesic.mathdoc.fr/item/DM_2019_31_2_a1/
[1] Lupanov O.B., Asimptoticheskie otsenki slozhnosti upravlyayuschikh sistem, izd-vo MGU, Moskva, 1984, 138 pp.
[2] Yablonskii S.V., Vvedenie v diskretnuyu matematiku, Vysshaya shkola, Moskva, 2002, 384 pp.
[3] Yablonskii S.V., “Nekotorye voprosy nadezhnosti i kontrolya upravlyayuschikh sistem”, Matem. voprosy kibernetiki, 1 (1988), 5–25
[4] Redkin N.P., Nadezhnost i diagnostika skhem, izd-vo MGU, Moskva, 1992, 192 pp.
[5] Borodina Yu. V., Borodin P. A., “Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements”, Discrete Math. Appl., 20:4 (2010), 441–449 | DOI | DOI | MR | Zbl