Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs
Diskretnaya Matematika, Tome 31 (2019) no. 2, pp. 14-19
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We consider Boolean circuits in Zhegalkin basis and describe all Boolean functions that can be implemented by a circuit admitting a complete fault detection test of length $1$ in case of constant faults of type “1” at gate outputs.
Keywords: Boolean circuits, constant faults, fault detection tests, Zhegalkin basis.
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Yu. V. Borodina. Easily testable circuits in Zhegalkin basis in the case of constant faults of type “1” at gate outputs. Diskretnaya Matematika, Tome 31 (2019) no. 2, pp. 14-19. http://geodesic.mathdoc.fr/item/DM_2019_31_2_a1/

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