Geodesic
Lower bounds for lengths of single tests for Boolean circuits
Diskretnaya Matematika, Tome 29 (2017) no. 2, pp. 53-69

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We obtain nontrivial lower bounds for lengths of minimal single fault detection and diagnostic tests for Boolean circuits in wide classes of bases in presence of stuck-at faults at outputs of circuit gates.
Keywords: Boolean circuit, stuck-at fault, single fault detection test, single diagnostic test. 
@article{DM_2017_29_2_a4,
     author = {K. A. Popkov},
     title = {Lower bounds for lengths of single tests for {Boolean} circuits},
     journal = {Diskretnaya Matematika},
     pages = {53--69},
     publisher = {mathdoc},
     volume = {29},
     number = {2},
     year = {2017},
     language = {ru},
     url = {http://geodesic.mathdoc.fr/item/DM_2017_29_2_a4/}
}
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K. A. Popkov. Lower bounds for lengths of single tests for Boolean circuits. Diskretnaya Matematika, Tome 29 (2017) no. 2, pp. 53-69. http://geodesic.mathdoc.fr/item/DM_2017_29_2_a4/