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Single tests for logical gates
Diskretnaya Matematika, Tome 27 (2015) no. 2, pp. 73-93 Cet article a éte moissonné depuis la source Math-Net.Ru

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The paper is concerned with checking problems for failure and state diagnostics of $N$ gates implementing in a working condition a given Boolean function $f(x_1,\ldots,x_n)$. This problem is solved by composing single-output circuits from these gates and analyzing the output values of these circuits on all input tuples of variables. An arbitrary constant malfunction at the output of any single gate is allowed. It is required to minimize the number of circuits required for a check for failure and determination of all states of all gates. Exact values for the minimal possible number of such circuits are obtained.
Keywords: gate, malfunction, fault detection test
Mots-clés : circuit, diagnostic test. 
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     url = {http://geodesic.mathdoc.fr/item/DM_2015_27_2_a4/}
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K. A. Popkov. Single tests for logical gates. Diskretnaya Matematika, Tome 27 (2015) no. 2, pp. 73-93. http://geodesic.mathdoc.fr/item/DM_2015_27_2_a4/

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[3] Popkov K. A., “Proveryayuschie i diagnosticheskie testy dlya kon'yunktorov, diz'yunktorov i invertorov”, Vestnik Moskovskogo universiteta. Seriya 1. Matematika. Mekhanika, 2014, no. 6, 40–44